Olympus Corporation

Olympus Optical Company, Ltd.

Keiji Shimizu

Kazuhiro Hayashi

Kenji Kawasaki

Yoshihiro Kawano

Minoru Sukekawa

Tsuyoshi Mochizuki

Koji Suzuki

Daisuke Nishiwaki

Takashi Nagano

Atsushi Miyawaki

Susumu Honda

Kenji Tajima

Masakazu Shimada

Kazuo Kajitani

Yoshihiro Hayashi

Yasushi Aono

Masayoshi Karasawa

Shuzo Mishima

Kiyonobu Kurata

Takashi Fukano

Yuko Obuchi

Masaaki Iwase

Keiichi Iizuka

Microscope body

The exposure time for obtaining a bright image in an image-acquisition optical system can be reduced, and shifting of an image visually observed in an observation optical system is prevented, thus enabling stable observation. A microscope including an image-acquisition optical path for recording an image focused by an objective lens and an observation optical path for visually observing an image split-off from the image-acquisition optical path; and including an aperture stop, in the observation optical path, for stopping down the numerical aperture thereof to smaller than the numerical aperture of the image-acquisition optical path.

Zoom microscope including an image-acquisition optical path and an observation optical path

An optical apparatus minimizes autofluorescence and stray light as well as leakage of excitation light and efficiently utilizes illuminating light from a fluorescence illumination optical system to allow observation of a bright fluorescence image. An observation apparatus has an objective, an observation optical system unit including a variable magnification optical system, and an imaging optical system unit including an imaging lens and an eyepiece. A fluorescence illumination apparatus, which is provided separately, is removably attached to the observation apparatus. The fluorescence illumination apparatus has a light source, a collector lens unit, and a reflecting member placed between the objective and the observation optical system unit at a position displaced from the optical axis of the objective to make light from the light source incident on the objective. An excitation filter is provided between the light source and the reflecting member. An optical member for selectively transmitting fluorescent light emitted from a sample is placed between the objective and the observation optical system unit.

Optical apparatus

A microscope examination apparatus is provided that includes a light source for emitting excitation light or illumination light to a specimen placed on a stage; an objective lens opposing the stage and capable of focusing fluorescence or reflected light from the specimen; an image-forming lens for forming an image of the specimen obtained by the objective lens; and an image-capturing unit for capturing the image of the specimen forming by the image-forming lens, wherein a plurality of the objective lenses having different magnifying powers is provided, and an objective-lens switching mechanism for switching among the objective lenses is provided, and wherein a plurality of the image-forming lenses having different magnifying powers is provided, and an image-forming-lens switching mechanism for switching among the image-forming lenses is provided.

Examination apparatus, fluoroscopy apparatus, examination method, and experimental method

A transmission illumination apparatus for a microscope has an optically transparent sample mount plate on which a sample is mounted, a surface light source that projects substantially uniform illumination light toward the sample mount plate, and a light orientation member that restricts diffusion of the illumination light in relation to at least one direction.

Illumination apparatus for microscope

A illumination device for microscope, which has a illumination axis, includes illumination unit, which emits rays of illumination light, for illuminating a specimen, a field stop projection lens, which is located on the illumination axis between the illumination unit and specimen, a light deflector array, which is located on the illumination axis between the illumination unit and field stop projection lens in conjugation with the specimen, the light deflector array having micro optical deflection portions, which individually deflect the rays of illumination light from the illumination unit, and switch unit for switching between a state in which the rays of illumination light is applied to the specimen and a state in which the rays of illumination light is not applied to the specimen.

Illumination device for microscope

An illumination system for microscopy includes a light source, a first spectral element dispersing light from the light source, a reflecting member selectively reflecting light dispersed by the first spectral element, a second spectral element combining light reflected by the reflecting member, a dichroic mirror, an objective lens, and an image sensor. The first spectral element is placed at the front focal point of a first lens, the reflecting member is placed at a position where the back focal point of the first lens coincides with the front focal point of a second lens, and the second spectral element is placed at the back focal point of the second lens.

Illumination system for microscopy and observation or measuring method using the same

In a microscope system, illumination light rays are emitted from a light source. The illumination light rays are collimated and reflected from a mirror to the optical element array. The optical element array is located at a conjugate position of a specimen, and includes a plurality of micro mirrors arranged in a matrix form. The micro mirrors are individually controlled to selectively reflect the illumination light rays for illuminating the specimen. Thus, a predetermined pattern of the light rays is reflected from the optical element array to an objective lens. The illumination light rays are projected on the specimen from the objective lens and the specimen is illuminated by the predetermined illumination pattern.

Microscope system

Stereomicroscope

An incident-light fluorescence microscope including: (i) a transmission illuminating optical system which has a first optical member for receiving light emitted from a light source and extracting transmitted light and which irradiates the transmitted light onto a sample, and (ii) an observation optical system which has an objective lens and a second optical member and which is positioned closer to the objective lens than the sample. An incident-light fluorescence illuminating optical system is provided in the observation optical system, wherein the first optical member has a peak of transmittance at a wavelength longer than the fluorescent wavelength, and the second optical member selectively modulates only a wavelength transmitted through the first optical member.

Incident-light fluorescence microscope

A reflected fluorescence microscope is used to observe a fluorescent image of a stained specimen by reflected illumination, and includes a light source, an excitation filter for converting light from the light source into a plurality of narrow-band excitation lights, a dichroic mirror for reflecting the narrow-band excitation lights emerging from the excitation filter toward the specimen and transmitting therethrough the light emerging from the specimen, an absorption filter for absorbing an extra wavelength component from light emerging from the dichroic mirror and transmitting therethrough a wavelength component of the fluorescent image, an optical system for forming the fluorescent image of the specimen from the wavelength component transmitted through the absorption filter, and a transmission wavelength shifting filter for adjusting the ratio of the quantities of light in units of fluorochromes.

Reflected fluorescence microscope

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Fussa, Japan

Keiji Shimizu