Nikon Corporation

Sharp Kabushiki Kaisha Corporation

Panasonic Corporation

Panasonic Intellectual Property Corporation of America

Hitachi High-Tech Science Corporation

Sii Nanotechnology Inc.

Seiko Instruments Inc

Panasonic Intellectual Property Management Co., Ltd.

Mitsubishi Gas Chemical Company, Inc.

Hitachi High-Tech Corporation

Applied Materials, Inc.

Toppan Printing Co., Ltd.

Kabushiki Kaisha Yaskawa Denki

Shapr Kabushiki Kaisha

Nikin Corporation

Keiichi Tanaka

Tomohiko Yamamoto

Masahiro Oashi

Naoto Inoue

Hideki Ichioka

Koji Fujiwara

Hidetaka Ohto

Satoshi Nakayama

Toshimitsu Morooka

Akikazu Odawara

Satoru Kishimoto

Hidetaka Oto

Tomoyuki Okada

Wataru Ikeda

Andrew J Hazelton

Atsushi Nagata

Kazuo Chinone

Tomonori Nakamura

Tomokazu Kanamaru

Kouji Fujiwara

Germano Leichsenring

Masafumi Okubo

Mike Binnard

Yoshitaka Okumoto

Yuki Taoka

Takahiro Yamaguchi

Atsuhito Murai

Hisashi Nagata

Noriyuki Hirayanagi

Akira Takano

Yukio Kakizaki

Yutaka Hayashi

Kenji Masuda

Osamu Yamaji

Hirokazu Yoshioka

Yuji Kunitake

Tatsuji Ishikawa

Toshihisa Nakano

Toshihide Tsubata

Michael B Binnard

Yutaka Ishii

Mikio Katayama

Masaya Okamoto

Yasuyuki Mitsuoka

Satoshi Hashimoto

Noboru Noguchi

Toshiaki Fujii

Yasunobu Tagusa

Yoshiharu Kataoka

Hisao Okada

Isao Sugaya

Sumio Iijima

Yoshinori Shimada

Hiroshi Matsunaga

Tetsunori Tanaka

Xin Man

Wataru Nakamura

Toshinori Sugihara

Yo Yamamoto

Youji Yoshimura

Hiroaki Iwamoto

Yuji Maeda

Yukiharu Okubo

Kohei Matsui

Kazuki Kobayashi

Ken Yamashita

Junichi Tashiro

Taketo Maruyama

Takenori Yoshizawa

Kumi Harada

Kenichi Kitoh

Hideaki Takahashi

Kohei Yamaguchi

Hidehiro Maeda

Tomoko Katayama

Yasutoshi Murakami

Shingo Jogan

Satoshi Okabe

Ryosuke Yasui

Takao Adachi

Keiji Sakaguchi

Masahiro Yoshihashi

Masafumi Tamai

Junichi Chonan

Priangga Perdana Putra

Yasushi Yoda

Hiroo Ishikawa

Tomoyuki Adaniya

Ryuichirou Tominaga

Hiroaki Narushima

Nobukazu Ito

Shunji Bandow

Takaharu Miura

Kiyonori Kido

Makoto Hiroki

Manabu Yamazaki

Masataka Ohgaki

Norikazu Tagaki

Robert Martinek

Toshiyuki Gotou

This radiation analysis system comprises a transition edge sensor that detects radiation, a current detection mechanism that detects a current flowing in the transition edge sensor, and a computer sub-system that processes a current detection signal from the current detection mechanism. The computer sub-system is characterized by executing: a process for calculating a baseline current of the current detection signal; a process for calculating a wave height value of a signal pulse produced in the detection signal when the transition edge sensor has detected radiation; a process for acquiring correlation data based on the baseline current and the wave height value; and a process for correcting the wave height value of the signal pulse, or an energy value calculated from the wave height value, on the basis of the correlation data and the baseline current from before production of the signal pulse when radiation having unknown energy is detected.

Radiation analysis system, charged particle beam system, and radiation analysis method

To provide a radiation analyzer that can perform analyses by a long-term stable and high energy resolution without correcting a current flowing through a transition edge sensor (hereinafter referred to as TES) or a pulse height value of a signal pulse. The radiation analyzer includes: a TESconfigured to detect radiation; a current detection mechanismconfigured to detect a current flowing through the TES; a pulse height analyzerconfigured to measure a pulse height value based on the current detected by the current detection mechanism; a baseline monitor mechanismconfigured to detect a baseline current flowing through the TES; a first heaterwhose output is adjusted to stabilize a temperature of a first thermometerdisposed in a cold head that cools the TES; and a second heaterthat is disposed fairly close to the TESand whose output is adjusted to stabilize a baseline current.

Radiation analyzer

A pickup request system includes: a determination unit configured to determine presence or absence of a package in a delivery box provided on a site of a building and whether or not a user is present in a first predetermined range including the building; and a control unit configured to request pickup of the package when it is determined that the user has moved from within the first predetermined range to out of the first predetermined range while the package is present in the delivery box.

Pickup request system and pickup request method

A voice control information output system includes: a voice control information obtainment unit that obtains voice control information for controlling a device based on a voice received by a voice input terminal, from a voice control system that outputs the voice control information; and an output unit that outputs display-related information for displaying a content related to the voice control information.

Voice control information output system, voice control information output method, and recording medium

A radiation analysis apparatus includes an excitation source unit irradiating an object, for which the radiation analysis apparatus analyzes property or a structure, with a first radiation, a radiation detection unit including three or more radiation detectors that detect a second radiation generated from the object irradiated with the first radiation, a radiation focusing unit disposed between the object and the radiation detection unit, and focusing the second radiation, a position changing unit changing a relative positional relationship between the radiation focusing unit and the radiation detection unit, and a control unit controlling the position changing unit to change the positional relationship, based on first information which is stored in a storage unit and indicates an intensity distribution of the second radiation emitted from the radiation focusing unit and second information indicating a distribution based on a detection count of the second radiation detected by each of the radiation detectors.

Radiation analysis apparatus

A radiation analyzing apparatus includes a radiation irradiation unit configured to irradiate an object with a first radiation, a radiation detection unit configured to detect a second radiation generated from the object irradiated with the first radiation, a radiation converging unit configured to disposed between the object and the radiation detection unit and to converge the second radiation on the radiation detection unit, a position changing unit configured to vary a relative positional relationship between the radiation converging unit and the radiation detection unit, and a driving unit configured to change the positional relationship.

Radiation analyzing apparatus and radiation analyzing method

A first device is installed at a first location in a first space visible to a user. A second device is installed at a second location in a second space not visible to the user. A control method acquires line-of-sight information indicating a line-of-sight direction of the user from a camera. The line-of-sight direction of the user is determined based on the line-of-sight information. In a case where the line-of-sight direction indicates a third location other than the first location, a second dictionary corresponding to the second device is acquired from a plurality of dictionaries including a first dictionary corresponding to the first device and the second dictionary. Sound data indicating speech of the user is acquired from a microphone, a control command corresponding to the sound data is generated using the second dictionary, and the control command is transmitted to the second device.

Control method, controller, and recording medium

An application information acquisition unit transmits a device list of unconnected devices, which are owned devices recorded in a local storage but not retrieved by a device retrieval unit, and connected devices, which are owned devices retrieved by the device retrieval unit, to an external server via an external network. A service list display unit displays a list of device cooperation services indicated in device cooperation service list information obtained by the application information acquisition unit from the external server and a list of devices determined to be owned devices by an owned device management unit on a display unit, whereby a user is prompted to select a device cooperation service.

Device cooperation service execution apparatus, device cooperation service execution method, and computer-readable recording medium

A method of controlling a plurality of equipment pieces by a controller including a microphone, a sensor, and a speaker includes collecting, with the microphone, sound around the controller, sensing, with the sensor, a location of a person with respect to the plurality of equipment pieces, generating sensing data based on the sensing, extracting an utterance for controlling the plurality of equipment pieces from the sound collected by the microphone, in accordance with the utterance, identifying a target equipment piece to be controlled among the plurality of equipment pieces, determining whether to control the target equipment piece based on the sensing data, when the control equipment piece is determined to be controlled, generating an audio response for verifying whether to control the target equipment piece in accordance with the utterance, and causing the speaker to output the audio response.

Control method, controller, and non-transitory recording medium

An X-ray analyzer includes: an excitation source for exciting a sample to radiate a characteristic X-ray; an X-ray detector that detects the characteristic X-ray; a collimator; at least one window that is provided between the sample and the X-ray detector and allows the characteristic X-ray to pass through; and a cooling unit that cools the window, wherein the window is laminated with one or more layer of an aluminum film and one or more layer of an insulating film, wherein a total thickness of the aluminum film of the at least one window is equal to or greater than 150 nm and is less than 300 nm, and wherein a size of the collimator is set such that a quantity of radiant heat to the X-ray detector of the atmospheric temperature when the window is not present is equal to or less than 10 &#x3bc;W.

X-ray analyzer

An X-ray analysis device includes an electron gun, an X-ray optical member, a first detection unit and a second detection unit, and a distance changing mechanism. The X-ray optical member guides characteristic X-rays emitted from a sample to at least any one of the first detection unit or the second detection unit. The first detection unit is formed such that energy resolution is given relative priority over counting efficiency in contrast to the second detection unit. The second detection unit is formed such that counting efficiency is given relative priority over energy resolution in contrast to the first detection unit. The distance changing mechanism changes the distance between each of the first detection unit and the second detection unit and the X-ray optical member in an axial direction of an optical axis of the X-ray optical member.

X-ray analysis device

A first device is installed at a first location in a first space visible to a user. A second device is installed at a second location in a second space not visible to the user. A device control method acquires line-of-sight information indicating a line-of-sight direction of the user from a camera. The line-of-sight direction of the user is determined based on the line-of-sight information. In a case where the line-of-sight direction indicates a third location other than the first location, the second device is identified as an object of control. Sound data indicating speech of the user is acquired from a microphone, a control command corresponding to the sound data is generated, and the control command is transmitted to the object of control.

Device control by speech commands with microphone and camera to acquire line-of-sight information

A wave height analyzer generates pre-sensitivity correction data using a radiation pulse signal transmitted from a room temperature amplifier, a heater value acquired from a temperature control section, a base line of a current flowing to a TES acquired from a base line monitor mechanism. The wave height analyzer outputs the pre-sensitivity correction data to a sensitivity correction arithmetic operation unit and receives post-sensitivity correction data, on which sensitivity correction is performed. The wave height analyzer generates composite data of a combination of the pre-sensitivity correction data and the post-sensitivity correction data. A spectrum display section receives pieces of composite data sequentially created by the wave height analyzer and displays at least one of a spectrum before sensitivity correction and a spectrum after sensitivity correction, in response to receiving an operator's request.

Radiation analyzing apparatus

A superconductive transition edge sensor detects radiation. A wave height analyzer generates an energy spectrum of radiation using a detection signal which is output from the superconductive transition edge sensor. A temperature control section and a base line monitor mechanism acquire a physical quantity of data having correlation with detection sensitivity of the superconductive transition edge sensor. A sensitivity correction arithmetic operation unit associates the physical quantity of a plurality of pieces of the acquired data at a plurality of different timings over a predetermined period of time with the detection signal at a certain timing and corrects the detection signal at the certain timing in accordance with the detection sensitivity of the superconductive transition edge sensor by using information regarding the correlation between the physical quantity of the plurality of pieces of data and the detection sensitivity of the superconductive transition edge sensor.

An X-ray fluorescence analysis apparatus is provided with: an excitation source configured to excite an analysis target sample to emit a characteristic X-ray; an X-ray detector configured to detect the characteristic X-ray emitted from the analysis target sample; and an electromagnetic wave shield and a heat shield that are sequentially arranged from the analysis target sample toward the X-ray detector. The electromagnetic wave shield is provided with a through hole portion on which a through hole through which the characteristic X-ray passes is formed, the through hole having a size equal to or smaller than 50 &#x3bc;m. The heat shield is provided with a window portion through which the characteristic X-ray is passed through.

X-ray fluorescence analysis apparatus

Growing community of inventors

Osaka, Japan

Keiichi Tanaka