Samsung Electronics Co., Ltd.

Kee-won Joe

Jong-chul Shin

Jong-Ho Kim

Hae-Young Rha

Cheul-hee Hahm

Tae-young Lee

Sang-jun Yang

The display apparatus includes: a display; a decoder which decodes an image in unit of a MCU; a scaler which scales the decoded image; a memory which stores the scaled image; and a controller which controls the display to display the scaled image, sets an RAU structure of the image, and further stores in the memory image information corresponding to the RAU structure. Thus, even if a decoded and scaled image is zoomed in, the quality of the zoomed image may be maintained at a high level.

Display apparatus and image processing method thereof which decode an image in unit of minimum coded unit

Provided are a mapping method and a video system for mapping pixel data included in the same pixel group to the same bank of a memory, A method for mapping the position of pixel data of a picture to an address of a memory comprises a pixel group dividing operation and an address mapping operation. The pixel group dividing operation divides the pixels of the picture into at least one pixel group. The address mapping operation maps pixel data of pixels included in the same pixel group to the same bank of the memory.

Mapping method and video system for mapping pixel data included in the same pixel group to the same bank of memory

A system-on-chip (SOC) having built-in-self-test (BIST) circuits and a self-test method of the SOC are provided. The SOC having the BIST circuits includes intellectual property (IP) blocks having BIST logic circuits and a BIST control unit. The BIST logic circuit operates in a normal or a test mode in response to control data received through a system bus, and outputs test result data in the test mode. The BIST control unit tests the IP blocks by transferring the control data, a command signal, test pattern data, and test address signals to the BIST logic circuit through the system bus, and compresses and stores the test result data received through the system bus in the test mode.

System-on-chip (SOC) having built-in-self-test circuits and a self-test method of the SOC

A bus system including a bus arbiter and a plurality of masters. The bus arbiter grants bus control to one of the plurality of masters. When a master with bus control sends a read command, bus control is transferred to another one of the plurality of masters, thereby increasing the efficiency of the bus system. A method including sending a read command and transferring bus control to another one of a plurality of masters before receiving the response to the read command.

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Yongin-si, South Korea

Kee-won Joe