Canon Kabushiki Kaisha

Kazuyuki Ota

Masakazu Matsugu

Kenji Saitoh

Yusuke Mitarai

Hiroshi Yoshikawa

Masafumi Takimoto

Hiroyuki Shinbata

Tomoaki Higo

Kazunori Okudomi

An information processing apparatus includes at least one projection unit configured to project a light pattern on a measuring target object, at least one imaging unit configured to capture an image of the measuring target object with the light pattern projected thereon, a measurement unit configured to measure a distance from the at least one projection unit or imaging unit to the measuring target object based on the image captured by the at least one imaging unit, a determination unit configured to determine whether a measured distance is valid, and a control unit configured to reduce luminance of a light pattern, included in a projected light pattern, which is projected on an area with respect to which the measured distance is determined by the determination unit to be valid.

Information processing apparatus and method for measuring a target object

A three-dimensional measurement apparatus comprises a light irradiation unit adapted to irradiate a measurement target with pattern light, an image capturing unit adapted to capture an image of the measurement target, and a measurement unit adapted to measure a three-dimensional shape of the measurement target from the captured image, the three-dimensional measurement apparatus further comprising: a change region extraction unit adapted to extract a change region where a change has occurred when comparing an image of the measurement target captured in advance with the captured image of the measurement target; and a light characteristic setting unit adapted to set characteristics of the pattern light from the change region, wherein the measurement unit measures the three-dimensional shape of the measurement target at the change region in a captured image after irradiation of the change region with the pattern light with the characteristics set by the light characteristic setting unit.

Three-dimensional measurement apparatus, three-dimensional measurement method and storage medium

A measurement apparatus includes an illumination light setting unit which sets illumination light having an optical characteristic corresponding to a microstructure which is formed on the surface of a measurement target and is to be measured, and a measurement unit which measures reflected light when the measurement target is irradiated with the illumination light. In addition, an extraction unit extracts, from the measured reflected light, information about the surface shape of the measurement target and the microstructure formed on the surface.

Measurement apparatus and method for measuring surface shape and roughness

This invention is directed to extract the scattering characteristic of a measurement target together when measuring the surface shape in a measurement system, which measures the surface shape of a measurement target, by the pattern projection method. To accomplish this, the measurement system includes an illumination unit which irradiates a measurement target with dot pattern light, a reflected light measurement unit which receives the reflected light at a reflection angle almost equal to a incident angle, and a reflected light extraction unit which extracts the inclination of the surface of the measurement target, based on the shift amount between the light receiving position of the received reflected light and a predetermined reference position, and extracts the luminance value of the reflected light and the dot diameter of the dot pattern light as information about the scattering characteristic.

Measurement system and measurement processing method

An information processing apparatus includes an obtaining unit configured to obtain first information regarding a distribution of reflected light from a target to be measured and second information regarding geometrical-optics components of the reflected light, a calculating unit configured to calculate third information on the basis of the first information and the second information, the third information indicating an approximation of the distribution of reflected light, and an output unit configured to output information regarding wave-optics components of the reflected light on the basis of the third information.

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Yokohama, Japan

Kazuyuki Ota