Rigaku Corporation

Kazuyuki Matsushita

Takuto Sakumura

Yasukazu Nakaye

Yuji Tsuji

Masataka Maeyama

Kimiko Hasegawa

Tetsuya Ozawa

Takeyoshi Taguchi

Koichi Kajiyoshi

Satoshi Mikusu

A control apparatus, system, method and program that enable simultaneous measurement of counts of multiple energy ranges in an efficient configuration are provided. A control apparatusfor controlling an X-ray detectorand outputting a measurement result comprises a setting sectionconfigured to set the energy range of X-rays to be detected for each unit region of the X-ray detector, a data management sectionconfigured to acquire a count value of the set energy range for each unit region as measurement data by a result of the X-ray measurement, and an outputting sectionconfigured to output the measurement data. Thus, counting of multiple energy ranges can simultaneously be measured.

Control apparatus, system, method, and program

A detector capable of securing space for arranging pixels in the vicinity of edges of adjacent readout chips according to design of counting circuits. A 2-dimensional hybrid pixel array detector configured to detect radiation rays, including a detection unit configured to detect the radiation rays incident in a region of each pixel, and a plurality of the readout chips including counting circuitsrespectively connected to each of the pixels, the counting circuitshaving a smaller set pitch than the pixelsalong a certain direction in a detection surface. The regions occupied by the pixels and counting circuits corresponding to the pixels overlapping at least partially, and the connection being made in the overlapping regions.

Detector

A processing apparatus that enables margin correction of X-ray intensity data includes a calculation unit configured to calculate an expansion rate of X-ray intensity data detected in a unit region on a marginal side on a basis of an intensity distribution resulted from detection of uniform X-ray and a first function generation unit configured to generate an allocation function that allocates the X-ray intensity data detected in the unit region on the marginal side to an outside unit region, on the basis of the expansion rate. Enabling margin correction on the basis of the intensity distribution resulting from detection of uniform X-ray makes it possible to correct the distortion of intensity distribution on the marginal side. As a result, it is possible to expand the detection region of X-ray intensity data.

Processing apparatus, method, and program

Provided are a data processing apparatus a method of obtaining the characteristic of each pixel and a method of data processing, and a program. A data processing apparatusto correct X-ray intensity data measured by a pixel detector includes a characteristic storage unitto store the characteristic of each pixel in a specific detector, a correction table generation unitto apply a measurement condition input as that in measurement by a specific detector and a value expressing the characteristic of each pixel to an approximate formula expressing the count value of each pixel and to generate a correction table for the specific detector using the calculation result of the approximate formula, and a correction unitto correct the X-ray intensity data measured by the specific detector using the generated correction table.

Data processing apparatus, method of obtaining characteristic of each pixel and method of data processing, and program

The X-ray data processing apparatus to estimate a true value from an X-ray count value detected by the pixel array X-ray detector of a photon counting system includes a management unitto receive and manage a detection value for each detection part, an effective area ratio calculation unitto calculate a ratio of a detection ability under the influence of the charge share to an original detection ability in the detection part as an effective area ratio of the detection part using data regarding the detection part and data regarding an X-ray source and a detection energy threshold value, and a correction unitto correct the managed count value using the calculated effective area ratio to estimate a true value.

X-ray data processing apparatus and method and program for the same

An X-ray data processing apparatus for processing X-ray data that is obtained by simultaneously measuring X-rays of multiple wavelengths. The apparatus includes a management unitto receive and manage X-ray data that is detected by a detector, a calculation unitwhich calculates a detection amount of charge sharing events in lower energy side data caused by higher energy X-ray, based on the higher energy side data obtained using a threshold value on a higher energy side and the lower energy side data obtained using a threshold value on a lower energy side of the received X-ray data, and a correction unitto reconfigure the lower energy side data using the calculated detection amount. The apparatus can remove a residual image of an X-ray on a higher energy side which remains in data on a lower energy side.

X-ray data processing apparatus, X-ray data processing method, and X-ray data processing program

There are provided a radiation detector capable of detecting radiation without occurrence of dead time while maintaining an exposure state in which radiation enters continuously, and an X-ray analysis apparatus and a radiation detection method using the radiation detector. A radiation detectorthat detects radiation in synchronization with an external apparatus, includes: a sensorthat generates pulses when radiation particles are detected; a plurality of countersprovided so as to be able to count the pulses; and a control circuitconfigured to switch a counter to count the pulses among the plurality of counters, when receiving a synchronization signal from the external apparatus

Radiation detector, and X-ray analysis apparatus and radiation detection method using the same

A wavelength-classifying type X-ray diffraction device bombards a sample with characteristic X-rays generated from an X-ray generation source, and detects characteristic X-rays diffracted by the sample using an X-ray detector. The X-ray generation source is composed of several metals of different atomic number, respective metals generating several characteristic X-rays of different wavelengths. An X-ray detector is composed of several pixels for receiving X-rays and outputting pulse signals corresponding to X-ray wavelengths. Pixels are respectively furnished with classification circuits. The classification circuits classify and output pixel output signals based on each of characteristic X-ray wavelengths. X-ray intensity is detected on a per-wavelength basis in individual pixels. Measurement data based on different wavelength X-rays are acquired simultaneously in just one measurement. Data of diffracted X-rays of different wavelengths are acquired using the entire region of the receiving surface of a two-dimensional detector.

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Ome, Japan

Kazuyuki Matsushita