The Furukawa Electric Co., Ltd.

Kazuyou Mizuno

Yu Mimura

Mieko Yamagaki

Takeshi Takagi

Hiroyuki Abe

Koji Masuda

Shingo Watanabe

Katsuki Suematsu

Kanji Tanaka

Akira Fujisaki

Tetsuro Wada

Hiroshi Tajima

Tatsuya Hatano

Atsushi Hiraizumi

Koichi Shintomi

Abe Hiroyuki

A component for peeling the coating and breaking the optical fiber, which comprises the first member made of resin material including a groove portion enabling to receive a coated optical fiber, an optical fiber cutting blade and a coat removing blade integrally formed within the groove portion, and a breaking portion in an intermediate portion, and the second member made of resin material including a groove portion corresponding to the groove portion in the first member enabling to receive a coated optical fiber, a coat removing blade corresponding to the coat removing blade in the first member, and a breaking portion in an intermediate portion corresponding to the breaking portion in the first member.

Optical fiber cutting blade, optical fiber cutting device and method of cutting off the optical fiber, as well as component for peeling the coating and breaking the optical fiber and method of peeling the coating and breaking the optical fiber

A light input/output terminal modulecomprises a jacket tubeand a flange. A glass portionof the optical fiber is inserted in the center portion thereof. To efficiently remove the leaked light in a claddingto the jacket tube, the jacket tubeis made of silica glass or the same material as that of the cladding. The jacket tubeis fixed by fusion splicing or adhesion to the cladding so as to integrally unify the jacket tubeand the cladding. The beam diameter at the fiber end portion is enlarged by an optical component which fusion bonds the tip end of the optical fiber to the coreless fiber so that the optical power density at the light input/output terminal module is reduced.

Light input/output terminal module of the optical components and beam converting apparatus

The invention provides a Stokes parameter measurement device and Stokes parameter measurement method that enable high-precision measurement. The Stokes parameter measurement device comprises a polarization splitting device which comprises an optical element formed of a birefringent crystal material and which, by means of the optical element, splits signal light to be measured into a plurality of polarized light beams and adjusts the polarization state of one or more among the plurality of polarized light beams, and a light-receiving portion for performing photoelectric conversion of an optical component of the signal light split by and emitted from the polarization splitting device.

Stokes parameter measurement device and method

An object is to accurately measure the Stokes parameters, without the occurrence of polarization fluctuations or PDL during the splitting of the incident light. When the incident light is made incident on a first-stage prism, the light is split into two first splitting light rays. Next, the first split light rays are respectively incident on a pair of prisms of a second stage. Each of the pair of first split light rays is split into two rays by a second-stage prism, to obtain four second split light rays.

A thin film deposition method for producing an optical film with an optical characteristic on a deposition substrate in a vacuum chamber is provided. The method may include preparing in the vacuum chamber a deposition source which is a source of the film producing material; holding the deposition substrate with a substrate holding member; arranging the deposition substrate and the deposition source such that, given that a vertical distance from the center of the deposition substrate to the deposition source is defined as ZK and a horizontal distance between the deposition substrate and the deposition source as Xk, Xk/Zk is set to satisfy a following equation 0.48&#x2266;Xk/Zk&#x2266;0.78; rotating the deposition substrate on a rotational axis which is orthogonal to the deposition substrate; and evaporating the film producing material of the deposition source to perform deposition on the deposition substrate.

Thin film deposition method and thin film deposition apparatus

The optical thickness of a film formed on a substrate is controlled precisely to manufacture an optical filter having an accurate optical thickness. Time is counted during a film being formed on a substrate to note time points t with respect to a reference time set in advance. At least one of two optical characteristics of energy transmittance and energy reflectance when the film being formed on the substrate is irradiated with monitoring light is expressed by a function f(t) of the time points t based on a theoretical formula of the optical characteristic. The optical characteristic is measured by irradiating the film with the monitoring light at the time points t. A designed thickness achieving time at which the optical thickness of the film designed thickness is predicted. The film formation is stopped at the designed thickness achieving time, thereby obtaining the optical filter.

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Tokyo, Japan

Kazuyou Mizuno