Growing community of inventors

Yokohama, Japan

Kazuya Yamada

Average Co-Inventor Count = 5.13

ph-index = 3

The patent ph-index is calculated by counting the number of publications for which an author has been cited by other authors at least that same number of times.

Forward Citations = 19

Kazuya YamadaYuichi Yoshida (14 patents)Kazuya YamadaKengo Takemasa (14 patents)Kazuya YamadaAkihiro Takei (14 patents)Kazuya YamadaToshihisa Sone (14 patents)Kazuya YamadaYasuaki Harada (1 patent)Kazuya YamadaGentaro Takasuka (1 patent)Kazuya YamadaMazumi Itaya (1 patent)Kazuya YamadaHiroshi Kamei (1 patent)Kazuya YamadaHiroshi Otake (1 patent)Kazuya YamadaYoshimichi Hanai (1 patent)Kazuya YamadaTatuo Kato (1 patent)Kazuya YamadaKazuya Yamada (15 patents)Yuichi YoshidaYuichi Yoshida (17 patents)Kengo TakemasaKengo Takemasa (16 patents)Akihiro TakeiAkihiro Takei (14 patents)Toshihisa SoneToshihisa Sone (14 patents)Yasuaki HaradaYasuaki Harada (3 patents)Gentaro TakasukaGentaro Takasuka (2 patents)Mazumi ItayaMazumi Itaya (2 patents)Hiroshi KameiHiroshi Kamei (1 patent)Hiroshi OtakeHiroshi Otake (1 patent)Yoshimichi HanaiYoshimichi Hanai (1 patent)Tatuo KatoTatuo Kato (1 patent)
..
Inventor’s number of patents
..
Strength of working relationships

Company Filing History:

1. Lapis Semiconductor Co., Ltd. (14 from 702 patents)

2. Mitsui Engineering and Shipbuilding Company Limited (1 from 244 patents)


15 patents:

1. 12347757 - Semiconductor device and measurement device

2. 11854952 - Semiconductor device and measurement device

3. 11309234 - Semiconductor device having an oscillator and an associated integrated circuit

4. 10622944 - Semiconductor device and measurement device

5. 10615108 - Semiconductor device and measurement device

6. 10411715 - Semiconductor device, measurement device, and correction method

7. 10243515 - Semiconductor device and measurement device

8. 9838022 - Semiconductor device with oscillation frequency error correction

9. 9787250 - Semiconductor device and measurement device

10. 9584134 - Correcting temperature based oscillation frequency errors in semiconductor device

11. 9257377 - Semiconductor device and measurement device having an oscillator

12. 9230890 - Semiconductor device and measurement device

13. 9197217 - Semiconductor device, measurement device, and correction method

14. 8921987 - Semiconductor device and measurement device having an oscillator

15. 5090338 - Apparatus and process for treating waste incineration flyash

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12/17/2025
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