Sony Corporation

Osaka University

Yamato Scientific Co., Ltd.

Kazutaka Takeshita

Katsuaki Suganuma

Shijo Nagao

Akio Shimoyama

Dongjin Kim

Naoki Wakasugi

Wakasugi Naoki

A substrate evaluation chip is used to perform a test for evaluating a thermal characteristic of a mounting substrate that is mountable a power semiconductor. The substrate evaluation chip includes an insulating substrate bonded with the mounting substrate, and a heating pattern that is formed on a surface of the insulating substrate by a metallic film and is arranged by having a predetermined shape that is optimized to beat the insulating substrate more uniformly. The insulating substrate is a substrate in which an insulating film is formed on a surface of a single crystal substrate having a thermal conductivity of 250 [W/mK] or more.

Substrate evaluation chip and substrate evaluation device

There is provided a mobile terminal including a movement information acquisition section for acquiring movement information of a mobile terminal possessed by a user, a picked-up image acquisition section for acquiring a peripheral image of the mobile terminal, which is imaged by an imaging device, a transmission section for transmitting the movement information acquired by the movement information acquisition section to a server device which is connected to the mobile terminal via a network, a reception section for receiving community information which is generated by the server device based on a history of the movement information and which can be shared between the user possessing the mobile terminal and another user other than the user possessing the mobile terminal, and a display control section for displaying, on a display screen, a displayed image included in the community information in a superimposed manner on a peripheral image of the mobile terminal.

Mobile terminal, server device, community generation system, display control method, and program

Growing community of inventors

Tokyo, Japan

Kazutaka Takeshita