Average Co-Inventor Count = 3.22
ph-index = 7
The patent ph-index is calculated by counting the number of publications for which an author has been cited by other authors at least that same number of times.
Company Filing History:
1. Kabushiki Kaisha Toshiba (94 from 52,582 patents)
2. Kyoto University (12 from 810 patents)
3. Nec Corporation (2 from 35,496 patents)
4. The University of Tokyo (2 from 1,265 patents)
5. Shiseido Company, Limited (2 from 1,000 patents)
6. Toshiba Infrastructure Systems & Solutions Corporation (2 from 278 patents)
7. Sanyo Electric Co., Ltd. (1 from 8,766 patents)
8. Toshiba Corporation (1 from 193 patents)
9. Toshiba Carrier Corporation (1 from 107 patents)
10. Grelan Pharmaceutical Co., Ltd. (1 from 10 patents)
99 patents:
1. 12422410 - Structure evaluation system, structure evaluation apparatus, and structure evaluation method
2. 12339253 - Corrosion determination system, corrosion determination apparatus and corrosion determination method
3. 12332214 - Structure soundness evaluation using elastic waves on divided areas
4. 12306139 - Sensor module, sensor module installation device, and mounting method of sensor module
5. 12272236 - Vehicle information estimation system, vehicle information estimation apparatus, vehicle information estimation method, and non-transitory computer readable recording medium
6. 12169189 - Structure evaluation system, structure evaluation apparatus, and structure evaluation method
7. 12116513 - Adhesion/peeling method, and adhesion/peeling device
8. 12104986 - Structure evaluation system, structure evaluation apparatus, and structure evaluation method
9. 12098976 - Structure evaluation system and structure evaluation method
10. 12038349 - Inspection system, inspection apparatus, and inspection method
11. 12007363 - Measuring method and measuring device
12. 12001195 - State evaluation system, state evaluation apparatus, and state evaluation method
13. 11946906 - Damaged region determination system, determination apparatus and damaged region determination method
14. 11879815 - Non-contact non-destructive inspection system, signal processing device, and non-contact non-destructive inspection method
15. 11754530 - Structure evaluation method and structure evaluation system