Denso Corporation

Kazuo Nomoto

Tatsuya Suzuki

Naoki Yamamoto

A housing for an in-vehicle electronic control unit is disclosed. The housing includes: a case made of resin and formed into a box shape having an opening; a board received in the case and provided with an electronic part, the electronic part being mounted to the board; a cover made of metal and covering the opening of the case so that the board is arranged between the case and the cover; and multiple stays each provided to fix the cover or the case to a vehicle. The multiple stays include a first stay made of the resin and formed on the case, and a second stay made of the metal and formed on the cover.

In-vehicle electronic control unit housing

The vehicle-installed microcomputer system includes an A/D converter converting analog signal sent from an onboard sensor circuit into digital signal, a microcomputer which operates in one of regular mode where a predetermined arithmetic computation on the digital signal is performed, and sleep mode where the predetermined arithmetic computation is prohibited from being performed, a first power supply circuit supplied with electric power from outside to produce a power supply voltage to be applied to the microcomputer, a second power supply circuit supplied with electric power from outside through an interruption switch to produce a power supply voltage to be applied to the A/D converter and the sensor circuit, the second power supply circuit having an output voltage accuracy higher than that of the first power supply circuit. The power interruption switch is opened to prohibit the second power supply circuit from being supplied with electric power in the sleep mode.

Vehicle-installed microcomputer system that interrupts power to higher accuracy power supply circuit for sensor A/D converter in sleep mode

A diagnosing apparatus for a passenger protective system has transistors connected in series to both ends of a squib. Each of the transistors is made up of a plurality of transistor cells connected in parallel. A part of the transistor cells is utilized as a check transistor, which allows a small current incapable of igniting the squib to flow into the squib. The diagnosing apparatus turns on only the check transistor and detects a potential of the squib. Check transistor malfunction can be diagnosed on the basis of the detected potential. Because the check transistor is formed by a part of the transistor cells, if any trouble occurs therein, it can be considered that the power transistor formed by the remainder of the transistor cells also has any trouble. Therefore, the power transistor can be diagnosed from the detected potential of the squib.

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Toyokawa, Japan

Kazuo Nomoto