Sharp Kabushiki Kaisha Corporation

Kazuo Noda

Takahiro Inoue

Naruichi Yokogawa

Takeshi Nishino

A resistor array is provided in an element array. A mean value of a characteristic-value distribution is associated with a median of combined resistance values obtained by the element array. An array of trimming information pieces corresponding to combined resistance values larger than the median is set in a descending order of '15' to '8' in decimal number, and an array of trimming information pieces corresponding to combined resistance values less than the median is set in an ascending order of &#x2018;0&#x2019; to &#x2018;7&#x2019; in decimal number. A circuit converts trimming information derived from the trimming information generation circuit to generate element selection information for selecting turn-off resistors to obtain combined resistance values from the resistor array. Thus, the number of melted-and-cut fuses involved in generation of trimming information associated within the range of 'mean value&#xb1;2&#x3c3;' in the distribution is reduced.

Semiconductor integrated circuit and optical sensor device using the same

A carrier detection circuit of the present invention detects groups of pulses having a carrier frequency by using a detector, and integrates, by an integrator, a time in which the groups are detected, so as to generate a carrier detection level. Therefore, a transistor is only requested to have responsibility with respect to a frequency of a base band component, but not to the carrier frequency. This ensures a margin with respect to a response of the transistor, while allowing a feeble current to be used as charging and discharging currents for the capacitor. In this way, even if a capacitor in use has such a small capacity that the capacitor can be incorporated in an integrated circuit, the detection of the carrier is performed accurately. Meanwhile, by further providing a level change-over circuit, which increases an output of the detector relative to a reference integral value during a time in which the carrier is detected, it is possible to reduce malfunction caused by a light noise having swelling, in case an infrared ray remote control is used.

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Osaka, Japan

Kazuo Noda