Olympus Optical Company, Ltd.

Olympus Corporation

Mil-kin Inc.

Kazuo Kajitani

Yoshimasa Suzuki

Hisashi Goto

Yoshihiro Kawano

Hisashi Ode

Kenji Kawasaki

Hiroshi Ishiwata

Yoichi Iba

Yoshiaki Horikawa

Takashi Yoneyama

Hirofumi Tsuchida

Kazuhiko Osa

Tadashi Kimura

Takashi Nagano

Tatsuji Higuchi

Keiji Shimizu

Chikara Nagano

Kenji Karaki

Mayumi Odaira

Hideto Yamashita

Noriyuki Miyahara

Yasushi Kaneko

Makoto Shigehara

Masaaki Iwase

Kiyofumi Kano

Itaru Endou

Eisuke Arinobe

The optical system for a microscope includes an illumination lens group Gand an objective optical system. The objective optical system has an objective lens group G, a first image forming lens group G, and a second image forming lens group G, which are disposed in this order from the object side, and satisfies the following conditional expressions. NA&#xd7;2&#x2264;NA&#x2264;NA&#xd7;15 . . . (1); 0.01&#x2264;NA&#x2264;0.1 . . . (2); and 25&#x2264;M&#x2264;100 . . . (3), where NAdenotes the numerical aperture of the illumination lens group G, NAdenotes the numerical aperture of the objective lens group G, and Mdenotes the image-formation magnification of the objective lens group G

Optical system for microscope, and microscope in which same is used

A focusing method includes a step of preparing a microscope, a step of mounting a sample, and a predetermined processing step, the predetermined processing step includes a step of receiving light emitted from the observation optical system, a step of obtaining the quantity of light based on light from a predetermined region of the received light, a step of calculating a difference or a ratio between the quantity of light in the predetermined region and the quantity of light as a reference, a step of comparing a calculation result with a threshold, and a step of changing the distance between the sample and the observation optical system, and in the step of preparing, a partial region of illumination light is shielded or darkened, and when the result of the calculation is equal to or smaller than the threshold, the predetermined processing step is terminated.

Focusing method, measuring method, principal point detecting method, focusing device, measuring device, and principal point detecting device

A sample shape measuring method includes a step of preparing illumination light passing through a predetermined illumination region, a step of applying the illumination light to a sample, and a predetermined processing step. The predetermined illumination region is set such that the illumination light is applied to part of inside of a pupil and outside of the pupil, a light intensity of the illumination light incident on the predetermined illumination region differs between a center and a periphery. The predetermined processing step includes a step of receiving light transmitted through the observation optical system, a step of obtaining a quantity of light of the received light, a step of calculating a difference or a ratio between the quantity of light and a reference quantity of light, and a step of calculating an amount of tilt in a surface of the sample from the difference or the ratio.

Sample shape measuring method and sample shape measuring apparatus

A sample observation device includes an illumination optical system and an observation optical system, and the illumination optical system includes a light source, a condenser lens and an aperture member, and the observation optical system includes an objective lens and an imaging lens, and the aperture member has a light-shielding part or a darkening part and a transmission part, and the aperture member is disposed so that the light-shielding part or the darkening part includes an optical axis of the illumination optical system, and an image of an inner edge of the transmission part is formed inside of an outer edge of the pupil of the objective lens, and an image of an outer edge of the transmission part is formed outside of the outer edge of the pupil of the objective lens.

Sample observation device and sample observation method

A microscope system () includes a microscope () and an observation unit () provided separately from the microscope. The microscope includes a microscope objective lens (), an image pickup element () disposed at a position at which an image is formed through the microscope objective lens, and a first control apparatus () connected with the image pickup element. The observation unit includes a second control apparatus (), a display device () connected with the second control apparatus, and a magnifier optical system () arranged at a predetermined distance from the display device. The microscope system further includes a communication apparatus () for communication between the first control apparatus and the second control apparatus so that an image picked up by the image pickup apparatus is displayed on the display device.

Observation unit and microscope system equipped with observation unit

A microscope objective lens has an aspheric-surface lens, and a first lens nearest to an object side is a negative lens. It is desirable that at least any one surface of the first lens nearest to the object side is an aspheric surface. Moreover, it is desirable that the microscope objective lens satisfies the following conditional expression (1)&#x2212;20&#x3c;&#x2212;0.1&#x2003;&#x2003;(1)

Microscope objective lens

Observation over a superwide field of view is possible with a short, lightweight, and inexpensive eyepiece optical system and a binocular barrel. A microscope optical system includes an objective optical system configured to collect light from a specimen; an imaging optical system configured to image the light coming from the specimen and collected by the objective optical system; and an eyepiece optical system configured to magnify the image of the specimen formed by the imaging optical system and form a virtual image in an eye of an observer, wherein the following conditional expressions are satisfied,250/&#x2003;&#x2003;(1)&#x2003;&#x2003;(2)&#x2003;&#x2003;(3)0.4&#x3c;&#x3c;0.95&#x2003;&#x2003;(4).

Microscope optical system

Provided is an inverted microscopecomprising an objective optical systemthat collects light from a specimen A; an image-forming optical systemthat images the light from the specimen A that has been collected by the objective optical systemto form an intermediate image; a relay optical systemthat relays the intermediate image B of the specimen A formed by the image-forming optical system; a binocular lens barrelthat splits the light from the relay optical system; a pair of ocular optical systemsthat image, in a magnified manner, the intermediate images that have been split by the binocular lens barrelon eyes E of an observer as virtual images; wherein the following conditional expressions are satisfied:=()&#xd7;&#x3b2;&#x2003;&#x2003;(1),&#x2003;&#x2003;(2), and0.3&#x3c;&#x3c;0.9&#x2003;&#x2003;(3).

Inverted microscope

A microscope objective lens satisfies the following conditional expressions (1) and (2).0.05&#x3c;NA&#x3c;0.4&#x2003;&#x2003;(1)3 mm&#x3c;/NA&#x3c;50 mm&#x2003;&#x2003;(2)

A microscope objective lens is constructed with fixed lens units having a numerical aperture NA which is 0.6&lE;NA&lE;0.8 and a magnification &bgr; which is 40&lE;&bgr;&lE;63, to observe a sample placed on a sample holding member and covered with a protective transparent member having a thickness t which is 0.1 mm<t<0.15 mm.

Microscope objective lens and microscope using the same

A microscope apparatus includes an objective lens, an imaging lens, a pupil relay lens, and an image relay lens. The primary image of a specimen is formed between the imaging lens and the pupil relay lens, and the image of the pupil of the objective lens is projected between the pupil relay lens and the image relay lens so that a pupil modulator is disposed at the position of the projected pupil image. This arrangement makes it possible to produce pupil modulation, observe various specimens, and set the optimum position of an eyepoint.

Microscope apparatus

A microscope illumination optical system for an ultra-low magnification wherein the roughness of a light diffusing plate is not visible, and uniform illumination can be performed, and wherein specimens of weak contrast, a phase distribution, etc. can be made visible through adjustment of the numerical aperture by varying the aperture of an aperture stop. A collector lens system forms a first image of a light source. A first variable stop is placed at the first image position. An intermediate lens system has a second variable stop therein and forms an image of the first variable stop behind the system. A plurality of condenser lens systems of different magnifications are interchangeably placed between the intermediate lens system and a specimen plane. A condenser lens system having the smallest magnification is arranged such that an image of the second variable stop is formed at a finite position in the space of the specimen plane, and a position conjugate to the specimen plane is located closer to the light source than the first variable stop.

Microscope illumination optical system and microscope having the same

A microscope includes a light source for emitting light, a light condenser lens for condensing the light from the light source onto an object, a wavelength selection unit arranged between the light source and the light condenser lens for selecting the wavelength of the light entering the light condenser lens from the light source, a detector for detecting light from the object through the light condenser lens, and an optical path length adjusting unit arranged between the light source and the detector for adjusting the optical path length between the light condenser lens and the detector in order to correct the chromatic aberration of the light condenser lens appearing depending on the wavelength of the light selected by the wavelength selection unit.

Microscope with chromatic aberration correcting function

A microscope has an optical system in which the number of photographing optical paths can be increased. The optical system includes a light source, an illuminating optical system for radiating the illuminating light to a sample, an objective lens which is opposed to the sample, an imaging lens, which is arranged in an optical path of light passed through the objective lens, a first beam splitting block, arranged in an optical path between the objective lens and the primary image, for splitting the light passed through the imaging lens into at least three different directions, a second beam splitting block for splitting one of the light split by the first beam splitting block into a plurality of directions, an observation optical path which receives the light split by the second beam splitting block, and a plurality of photographing optical paths provided for the split light, wherein images of the same magnification are formed.

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Tokyo, Japan

Kazuo Kajitani