Seiko Instruments Inc

Kazunari Sugiura

Yoshikazu Kojima

Hiroaki Takasu

Hiroshi Mukainakano

Masanao Hamaguchi

Noritoshi Ando

Michiaki Yazawaw

Takayuki Takahashi

In a semiconductor integrated circuit device having laser-trimmable fuses and a trimming position pattern, in order to increase trimming accuracy and reduce the size of the positioning pattern, the fuses and the positioning pattern are formed using the same thin film. The trimming positioning pattern has an abrupt boundary between a high light reflectivity region and a low reflectivity region so that light reflectivity varies abruptly. To further reduce size, the trimming positioning pattern can be formed in pad areas of a integrated circuit chip or placed at intersections between scribe lines in a wafer.

Semiconductor device having trimmable fuses and position alignment marker formed of thin film

A plurality of combinations of overcurrent detection voltages and delay times are set in a charge and discharge control circuit. Accordingly, a charge and discharge control circuit is formed in which an overcurrent condition having unexpectedly large consumption current, such as a short circuit, does not damage the circuit. In one embodiment, the charge and discharge control circuit comprises a pair of external connection terminals connected to a secondary cell, a switch circuit connected between the cell and at least one of the external connection terminals, an overcurrent detection element connected in series with the power source for producing an output voltage in accordance with a current flowing therethrough, a voltage detecting circuit for determining whether the output voltage of the overcurrent detection element is above one of a plurality of overcurrent detection voltage levels and outputting an overcurrent detection signal for controlling the switch circuit to disconnect the power source from the external connection terminal, and a delay circuit for delaying the overcurrent detection signal by a delay time which depends upon the level of the output voltage of the overcurrent detection element.

Charge and discharge control circuit

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Chiba, Japan

Kazunari Sugiura