Panasonic Intellectual Property Management Co., Ltd.

Kazuhiro Yanagi

Takeshi Wakako

Tetsurou Kakizawa

Yuuji Terashima

Keiji Hirata

Takeshi Fujiyama

Takefumi Takagi

The present disclosure accurately detects the position of a shelf label disposed on a display shelf. A shelf label detection device may be provided with a shelf label position correction unit and a shelf label position identification unit. The shelf label position correction unit corrects a manual shelf label position set including a shelf label position that has been set in advance for a reference camera image, using an automatic shelf label position set which includes a shelf label position detected from a monitoring camera image using image recognition, thereby generating a corrected shelf label position set. The shelf label position identification unit uses the corrected shelf label position set to identify the shelf label position in the monitoring camera image.

Shelf label detection device, shelf label detection method, and shelf label detection program

A shelf monitoring device may be provided with a detector, a setter, a monitoring section, and an output section. The detector detects shelf labels attached to a display shelve to correspond to articles to be displayed on the display shelves, with video recognition of video data that includes the display shelves. Based on the position of the detected shelf label, the setter sets a monitoring area in which articles to be displayed on the display shelves in video data. The monitoring section monitors the shelving condition of the articles on the display shelves based on a change in video in response to the presence or absence of the article in the monitoring area. The output unit outputs the monitoring results according to the monitoring unit.

Shelf monitoring device, shelf monitoring method, and shelf monitoring program

There is provided a substance detecting device emits first invisible light to the inside and the outside of a detection region of a substance, changes an emitting direction of the first invisible light inside and outside the detection region, receives third invisible light which is passing light of the first invisible light through the reference cell in which a detection target substance is stored, outside of the detection region, and adjusts a temperature of the first invisible light and controls the wavelength of the first invisible light based on the wavelength characteristics of the third invisible light.

Substance detecting device, substance detecting system, and substance detecting method in which temperature control of light emission is performed

There is provided a plant stress detection apparatus including a first light source that radiates a reference beam of a first wavelength that has a characteristic of tending not to be absorbed in water toward a plant by optical scanning, a second light source that radiates a measuring beam of a second wavelength that has a characteristic of tending to be absorbed in water toward the plant by optical scanning, and a detector that detects presence or absence of water or undulation of the plant based on reflection light of the reference beam that is reflected at an irradiation position of the plant that has a first irradiation area and reflection light of the measuring beam that is reflected at an irradiation position of the plant that has a second irradiation area that is different from the first irradiation area.

Device for detecting plant stress and method for detecting plant stress

A substance detection sensor includes a first light source, a second light source, and a substance detector. The first light source irradiates a detection area including a plurality of target areas with reference light having a first wavelength through surface irradiation using optical scanning. The second light source irradiates the detection area with first measuring light having a second wavelength different from the first wavelength through the surface irradiation using the optical scanning. The substance detector detects a specific substance in the detection area based on reflection light of the reference light from the first light source and reflection light of the first measuring light from the second light source.

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Fukuoka, Japan

Kazuhiro Yanagi