Adv Antest Corporation

Kazuhiro Tsujikawa

Yoshihiro Kato

Yuki Watanabe

Naoya Kimura

Kazuhiro Iezumi

Tomoyuki Itakura

Shuichi Inage

Yuichiro Harada

Koji Miyauchi

Keisuke Kusunoki

A test apparatus is configured to test a DUT that does not support synchronous control from an external circuit. A main controller is configured based on an architecture that tests a device by synchronous control with the main controller itself as the master. A MIU is configured as an interface between the main controller and the DUT. The MIU establishes asynchronous control between it and the DUT with the DUT as the master, and establishes control between it and the main controller with the main controller as the master.

Test apparatus and test method

Growing community of inventors

Tokyo, Japan

Kazuhiro Tsujikawa