Canon Kabushiki Kaisha

Toppan Printing Co., Ltd.

Kazuhiro Takada

Taihei Mukaide

Masatoshi Watanabe

Kazunori Fukuda

Akira Asai

Toshiaki Aiba

Masahiro Okuda

Takashi Noma

Masanori Mitome

Shigeki Matsutani

Takeo Tsukamoto

Ichiro Nomura

Yoshikazu Banno

Hirokatsu Miyata

Michiyo Nishimura

Teruhiko Kai

An X-ray imaging apparatus and an X-ray imaging method for use in the X-ray imaging apparatus are provided. The X-ray imaging apparatus includes a separating element configured to spatially separate an X-ray generated by an X-ray generator unit and a scintillator array including a plurality of first scintillators arranged therein, where the separated X-rays are made incident on the first scintillators. Each of the first scintillators is configured to vary an intensity of fluorescence induced by the X-ray in accordance with an incident position of the X-ray. The X-ray imaging apparatus further includes a detector configured to detect the intensity of fluorescence emitted from the scintillator array.

X-ray imaging apparatus and X-ray imaging method

The invention is aimed to provide an X-ray imaging apparatus and the like ensuring a sufficient range of detecting the amount of X-ray movement with respect to the pixel size of a detector in comparison with the method disclosed in International Publication No. WO2008/029107. The X-ray imaging apparatus of the present invention has a splitting element which spatially linearly splits an X-ray beam; and a shielding unit which shields a part of the X-ray beam which is split by the splitting element and whose position is changed by a test object. The shielding unit has a region transmitting X-rays and a region having a shielding element shielding (blocking) X-rays. A dividing line between the X-ray transmitting region and the region having the shielding element is configured to be arranged obliquely so as to cross the linearly split X-ray beam.

To provide an X-ray imaging apparatus capable of easily adjusting the sensitivity or capable of easily extracting the amount of refraction of X-rays. An X-ray imaging apparatus irradiating an object to be measured with an X-ray beam from an X-ray source that generates X-rays of a first energy and X-rays of a second energy different from the first energy to measure an image of the object to be measured includes an attenuator and a detector. The attenuator attenuates the X-ray beam transmitted through the object to be measured and is configured so as to vary the amount of attenuation of the X-rays depending on a position on which the X-ray beam is incident. The detector detects the X-ray beam transmitted through the attenuator and is configured so as to detect the X-rays of the first energy and the second energy.

X-ray imaging apparatus

An X-ray imaging apparatus acquiring a differential phase contrast image of a test object without using a light-shielding mask for X-ray. The apparatus includes an X-ray source, a splitting element configured to spatially divide an X-ray emitted from an X-ray source and a scintillator configured to emit light when a divided X-ray beam divided at the splitting element is incident on the scintillator. The apparatus also includes a light-transmission limiting unit configured to limit transmitting amount of the light emitted from the scintillator and a plurality of light detectors each configured to detect the amount of light that has transmitted through the light-transmission limiting unit. The light-transmission limiting unit is configured such that a light intensity detected at each of the light detectors changes in response to a change in an incident position of the X-ray beam.

Provided is an X-ray imaging apparatus and an X-ray imaging method that offer an alternative for a refraction contrast method. A first scintillator and a second scintillator are used, the first scintillator generating first fluorescent light when X-rays separated by the separating element are incident thereon, and a second scintillator generating second fluorescent light when X-rays separated by the separating element are incident thereon. The second scintillator has a fluorescence emission intensity gradient such that an amount of emitted fluorescent light changes in accordance with a change in a position at which the X-rays are incident.

Provided is an X-ray imaging apparatus and a method of X-ray imaging, with which the apparatus can be reduced in size and a with which differential phase image or a phase image with consideration of an X-ray absorption effect of an object can be obtained. A displacement of X-rays that have been split by a splitting element and have passed through an object is measured. The displacement can be measured by using a first attenuation element having a transmission amount that continuously changes in accordance with the incident position of X-rays. At this time, an X-ray transmittance of an object that is calculated by using a second attenuation element having a transmission amount that does not change in accordance with the incident position of X-rays is used.

X-ray imaging apparatus and method of X-ray imaging

Provided is an X-ray imaging apparatus and a method of X-ray imaging, with which the apparatus can be reduced in size and a differential phase image or a phase image with consideration of an X-ray absorption effect of an object can be obtained. X-rays are spatially split, and a first attenuation element in which the transmission amount of X-rays continuously changes in accordance with the displacement when the X-rays pass through an object is used. Transmittance is calculated by using the first attenuation element and a second attenuation element that is different from the first attenuation element with respect to an amount of change or a characteristic of change in the transmission amount of X-rays in a direction of a displacement of the X-rays. A differential phase image and the like of the object are calculated using the transmittance.

An X-ray imaging apparatus for obtaining information on a phase shift of an X-ray caused by an object comprises: an splitting element for splitting spatially an X-ray emitted from an X-ray generator unit into X-ray beams; an attenuator unit having an arrangement of attenuating elements for receiving the X-ray beams split by the splitting element; and an intensity detector unit for detecting intensities of X-ray beams attenuated by the attenuator unit; and the attenuating element changing continuously the transmission amount of the X-ray depending on the X-ray incident position on the element.

An X-ray imaging apparatus and an X-ray imaging method can alleviate the influence of scattered X-rays relative to the obtained image. A differential phase contrast image or a phase contrast image of a detection object is computed by using a splitting element and an exposure control unit that synchronizes the X-ray scanning speed and the image acquisition speed of a detecting unit.

The invention is aimed to provide an X-ray imaging apparatus and the like ensuring a sufficient range of detecting the amount of X-ray movement with respect to the pixel size of a detector in comparison with the method disclosed in International Publication No. WO2008/029107. The X-ray imaging apparatus of the present invention has a splitting element which spatially linearly splits an X-ray; and a shielding unit which shields a part of the X-ray which is split by the splitting element and whose position is changed by a test object. The shielding unit has a region transmitting an X-ray and a region having a shielding element shielding an X-ray. A dividing line between the X-ray transmitting region and the region having the shielding element is configured to be arranged obliquely so as to cross the linearly split X-ray.

A simplified X-ray imaging apparatus is capable of computationally determining effective atomic numbers with small error factors even for light elements. In one embodiment, the X-ray imaging apparatus has an X-ray generation unit() for generating X-rays and a detector() for detecting X-rays transmitted through an object of examination(). A computing unit() computationally determines a quantity of an X-ray phase attributable to the object of examination and an X-ray transmittance of the object of examination from data detected by the detector. The computing unit also computationally determines an effective atomic number of the object of examination from &#x3c1;t determined from the quantity of the X-ray phase and &#x3bc;t determined from the X-ray transmittance.

X-ray imaging apparatus, X-ray imaging method and method of controlling X-ray imaging apparatus

A simplified X-ray imaging apparatus is capable of computationally determining effective atomic numbers with small error factors even for light elements. The X-ray imaging apparatus has an X-ray generation unit() for generating X-rays and a detector() for detecting X-rays transmitted through an object of examination(). A computing unit() computationally determines a quantity of an X-ray phase attributable to the object of examination and an X-ray transmittance of the object of examination from data detected by the detector. The computing unit also computationally determines an effective atomic number of the object of examination from &#x3c1;t determined from the quantity of the X-ray phase and &#x3bc;t it determined from the X-ray transmittance.

A color filter and a method of manufacturing a color filter is provided, wherein fluctuation of chromaticity of a color pattern for every opening can be controlled and the color filter has little color shading. One embodiment of the present invention is a substrate having a pattern comprising a transparent substrate and a grid partition wall pattern formed on the transparent substrate, wherein there are openings partitioned by the grid partition wall pattern, and wherein there is a pass through the grid partition wall pattern between at least two adjacent openings.

Substrate having pattern, color filter, liquid crystal display and method of manufacturing color filter

An electron-emitting apparatus is constituted by an electron-emitting device having an electroconductive film including electron-emitting portions, and an electrode for attracting electrons. An electrically insulated elongated region is formed in the electroconductive film to divide the film into a higher potential side and a lower potential side. The insulated region has a substantially periodical shape formed of portions projecting to the higher potential side and portions projecting to the lower potential side. Continuous electron-emitting portions are present at at least part of the portion projecting to the higher potential side in one period of the insulated region.

Growing community of inventors

Kawasaki, Japan

Kazuhiro Takada