Fujitsu Corporation

Fujitsu Semiconductor Limited

Spansion LLC.

Kazuhiro Mitsuda

Suguru Tachibana

Tatsuo Kato

Koji Okada

Shinji Miyata

Kogi Okada

An oscillation circuit including a reference voltage generation circuit that adds a proportional-to-absolute-temperature (PTAT) output, which increases in proportion to an absolute temperature, to a complementary-to-absolute-temperature (CTAT) output, which decreases in proportion to an absolute temperature, to generate and output a reference voltage. The oscillation circuit generates an oscillation signal having a desired and fixed frequency.

Oscillation circuit

An output circuit includes a current source and a first MOS transistor coupled in series between a power supply terminal and an output terminal. The first MOS transistor includes a backgate coupled to a drain of the second MOS transistor. The second MOS transistor includes a source coupled to a source of a third MOS transistor. The second MOS transistor includes a source coupled to backgates of the second and third MOS transistors. The backgates of the second and third MOS transistors are in a floating condition.

Output circuit

A band gap circuit includes a voltage generating circuit, and a first and a second switched capacitor circuits (SCC). Operational amplifier in the first and the second SCC are connected though a coupling capacitor. Capacitance of the coupling capacitor is smaller than that of a feedback capacitor in the first SCC. A PTAT voltage is obtained by multiplying a thermal voltage by a coefficient determined based on capacitances of input capacitors and feedback capacitors in each of the first and the second SCC, and the coupling capacitor. The voltage generating circuit generates a forward bias voltage that has a negative temperature-dependency at a p-n junction. The PTAT voltage is added to the forward bias voltage to generate a reference voltage independent of temperature.

Band gap circuit

Included are a first unit including a DAC which generates a comparison signal serving as an object of comparison with the first analog signal, taking in and retaining the first analog signal, a second unit including a DAC which generates a comparison signal serving as an object of comparison with the first analog signal, taking in and retaining the second analog signal, a first switch connecting the first unit to an output side of the second unit, a comparator comparing a differential value between the first analog signal and the second analog signal with a differential value between the comparison signal of the first DAC and an output signal of the second DAC, and an electric potential control circuit controlling fluctuations in electric potentials of the first analog terminal and the second analog terminal.

Analog-to-digital converter

A successive approximation A/D converter includes a sample-hold amplifier circuit configured to sample and hold an input analog voltage to produce an internal analog voltage proportional to the input analog voltage with a voltage gain being smaller than 1, a switched capacitor D/A converter coupled to the sample-hold amplifier circuit and including a plurality of capacitors for storing electric charge responsive to the internal analog voltage, the switched capacitor D/A converter configured to switch couplings of the capacitors in response to a control signal to produce a comparison analog voltage responsive to the internal analog voltage and the control signal, a comparator coupled to the switched capacitor D/A converter to produce a comparison result signal responsive to the comparison analog voltage, and a control circuit coupled to the comparator to supply the control signal responsive to the comparison result signal to the switched capacitor D/A converter.

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Kasugai, Japan

Kazuhiro Mitsuda