Fuji Electric Co., Ltd.

The University of Tokyo

Fuji Electric Fa Components & Systems Co., Ltd.

Kazuhiro Koizumi

Yusuke Nakamura

Masaya Tabaru

Satoshi Yamazaki

Hideo Kanai

Naoki Takeda

Noritomo Hirayama

Takashi Iida

Yoshiki Hasegawa

Takamasa Asano

Yasuyuki Masunaga

Bo Li

Takashi Inui

Kozo Akao

Yu Taniguchi

Michiyasu Okada

Nobuyuki Takegawa

Satoshi Machida

Nobuya Suzuki

Hojun Yamauchi

Takuma Miyakawa

Hideyuki Konishi

Ryoichi Higashi

Yu Kawamura

A panelboard device according to an embodiment includes a housing and multiple devices stored in the housing. At least one of the multiple devices includes a device main unit; a state detecting unit configured to detect a state of the device main unit; a light emitting unit; and a light emission control unit configured to acquire information indicating the state of the device main unit from the state detecting unit, and to cause the light emitting unit to transmit an optical signal including information indicating the state.

Panelboard device

An analyzing device is provided, which can accurately analyze information related to generation sources. A generation source analyzing device is provided, which includes a measurement value acquiring unit to acquire time-series measurement values of a concentration of each of a plurality of measured object components at a measurement point, a correlation calculating unit to calculate a correlation value between the time-series measurement values of at least one set of the measured object components, and a generation source analyzing unit to analyze information related to generation sources of at least one measured object component based on the correlation value calculated by the correlation calculating unit.

Generation source analyzing device and generation source analyzing system

In gas analyzing apparatuses, interference noises should be reduced. A gas analyzing apparatus for analyzing component included in measuring object gas, including: a light emitting unit to irradiate laser light to the measuring object gas; a light receiving unit to receive the laser light having passed through the measuring object gas; an actuating unit to change an optical path length of the laser light by moving at least one optical element that is arranged in a light path where the laser light is passing; and a calculating unit to calculate concentration of the measuring object gas, based on signals detected by the light receiving unit in two states where the optical element is at different positions by n/2 times the wavelength of the laser light (where, n is integer) is provided.

Gas analyzing apparatus

It is aimed to analyze a gas component of a to-be-analyzed gas with a reduced influence of a liquid component contained in the to-be-analyzed gas. Provided is an analyzing apparatus for analyzing a gas component of an exhaust gas that has passed through a scrubber apparatus and the like. The analyzing apparatus includes a collecting nozzle configured to collect a to-be-analyzed gas, a liquid collecting unit configured to collect a liquid component contained in the to-be-analyzed gas collected by the collecting nozzle and to allow the to-be-analyzed gas to pass therethrough, a liquid discharging unit configured to discharge the liquid component collected by the liquid collecting unit, and an analyzing unit configured to analyze a gas component of the to-be-analyzed gas that has passed through the liquid collecting unit.

Analyzing apparatus and exhaust gas treating system

To analyze a generation source of a target component emitted in a form of a gas. To provide a generation source analyzing device comprising an acquiring section which acquires a concentration measurement value of a gas which includes a target component, and a concentration measurement value of a particle component which is generated in association with the gas, and an analyzing section which analyzes a distance from a measurement point to a generation source of the target component based on a concentration measurement value of the gas and a concentration measurement value of the particle component. The acquiring section may acquire a concentration measurement value of a precursor gas which becomes a raw material which generates the particle component, and a concentration measurement value of a secondary generated particle component which is generated from the precursor gas.

Generation source analyzing device and generation source analyzing method

A water quality analyzer for analyzing sample water. The water quality analyzer includes an excitation light irradiating optical system configured to irradiate the sample water with first light, a component in the sample water being excited by the first light to emit fluorescence, a scattered light irradiating optical system configured to irradiate the sample water with second light, the second light being scattered by microparticles in the sample water to form the scattered light, a fluorescence detecting optical system configured to detect a portion of the second light that has passed through the sample water, and to detect the emitted fluorescence, and a scattered light detecting optical system configured to detect a portion of the first light that has passed through the sample water, and to detect the scattered light.

Water quality analyzer

Despite the desire to measure the composition and concentration of the microparticles included in a gaseous body sample serving as the measurement target, there is a problem that measurement cannot be performed accurately due to the effect of substances other than the gaseous body sample adsorbing to a trapping body of the analyzing apparatus that traps the microparticles, for example. Therefore, provided is a microparticle composition analyzing apparatus that analyzes composition of microparticles contained in a gaseous body sample, comprising a gas analyzer and a control section that sequentially introduces into the gas analyzer a comparative gas and a sample gas caused by the microparticles generated by irradiating the gaseous body sample with a laser.

Microparticle composition analyzing apparatus

A signal processing device () includes a noise generator () configured to have a noise strength set therein and to output a noise with a set noise strength; a noise adder () configured to add the noise to an input signal including a weak signal as a measurement target to generate a noise-added signal; a threshold processing circuit () configured to perform threshold processing on the noise-added signal; an evaluating circuit () configured to extract, from an output signal output from the threshold processing circuit, a pulse signal component that meets a pulse waveform condition and to evaluate the extracted pulse signal; and a strength setting circuit () configured to set, in the noise generator, a noise strength to a desired value based on an output from the evaluating circuit.

Signal processing device and noise strength determining method

A multifunctional particle analysis device includes a particle measuring device and a particle composition analysis device. Calibration particles for which at least the number, size, and composition thereof are known are input to the particle measuring device and the particle composition analysis device and analyzed. The sensitivity of the particle measuring device is calibrated in accordance with the number and size of the calibration particles as measured by the particle measuring device, and the sensitivity of the particle composition analysis device is calibrated in accordance with the mass composition of the calibration particles as measured by the particle composition analysis device. Moreover, the irradiation axis of particles that enter the particle composition analysis device relative to a capturing unit is calibrated in accordance with a state in which the calibration particles are captured on the capturing unit of the particle composition analysis device.

Multifunctional particle analysis device and method of calibrating the same

A signal processing device for detecting a weak signal in an input signal. The device includes first and second pulse detectors and a determining circuit. The first pulse detector adds noise to the input signal, and processes the noise-added signal using a first threshold, to thereby output a first signal having a first pulse waveform component, which corresponds to an interval in which a level of the noise-added input signal exceeds the first threshold. The second pulse detector receives the input signal in parallel with the first pulse detector, and processes the input signal using a second threshold, to thereby output a second signal having a second pulse waveform component, which corresponds to an interval in which a level of the input signal exceeds the second threshold. The determining circuit determines whether each of the first and second pulse waveform components conforms to the weak signal.

Signal processing device and radiation measurement device

A particle analyzing apparatus including a particle measuring section that measures a number or concentration of particles in a sample gas; a component analyzing section that measures an amount of each component of the particles in the sample gas; a flow path that branches into a first flow path that introduces the sample gas to the particle measuring section and a second flow path that introduces the sample gas to the component analyzing section; a first adjusting section that is provided in the first flow path and dilutes the sample gas with a dilution gas and introduces the diluted sample gas to the particle measuring section to adjust a measurement range of the particle measuring section; and a second adjusting section that is provided in the second flow path and adjusts an introduction time during which the sample gas is introduced to the component analyzing section.

Particle analyzing apparatus

A particle detection device includes a scattered light detector detecting an intensity of light scattered by a particle irradiated with a laser, an incandescent light detector detecting an intensity of incandescent light from the particle being irradiated with the laser, and a signal processor including: a first peak hold circuit holding a peak in the intensity of the light scattered by the particle; a second peak hold circuit holding a peak in the intensity of the incandescent light from the particle; and a threshold value comparison circuit comparing the peak in the first peak hold circuit to a threshold and, when the peak in the first peak hold circuit exceeds the threshold, outputs a reset signal to the second peak hold circuit immediately thereafter so the peak previously in the second peak hold circuit is reset immediately after the peak in the first peak hold circuit exceeds the threshold.

Particle detection device

A particle measuring device includes: an optical resonator that reflects laser light back and forth between two facing reflective mirrors in order to amplify an energy of that laser light and form resonant laser light; a particle transport unit that transports particles in an aerosol to be measured across a beam path of the resonant laser light; a scattered light receiving unit that receives scattered light produced when the particles in the aerosol are irradiated by the resonant laser light; and a processor that receives light reception signals from the scattered light receiving unit, wherein the processor outputs light reception pulses according to the light reception signals and calculates time intervals between the light reception pulses that are temporally adjacent.

Particle measuring device

A particle beam forming device for forming either a linear or conical particle beam from a particle source in which particles are dispersed in a gas, includes: a reduced-pressure vessel in which pressure is reduced; a particle beam generating unit, which has one end arranged outside of the reduced-pressure vessel and an other end arranged inside the reduced-pressure vessel, and which captures the particle source from outside the reduced-pressure vessel and introduces the particle beam into the reduced-pressure vessel; and a particle beam evaluating unit for evaluating a spatial distribution of the particle beam inside the reduced-pressure vessel.

Particle beam forming device

Aspects of a laser-type gas analyzer can include a mid-infrared light reception signal processing and computing unit that calculates a gas concentration of the first gas to be measured on the basis of a mid-infrared light reception signal, a near-infrared light reception signal processing and computing unit that detects, at respective times, the gas concentration of the second gas to be measured, water concentration in a space, and alight amount decrement due to dust, on the basis of near-infrared light reception signal. Also included can be a gas concentration correcting unit that corrects the gas concentrations of the first and second gases to be measured using the water concentration and the light amount decrement.

Growing community of inventors

Sagamihara, Japan

Kazuhiro Koizumi