Mitutoyo Corporation

Kazuhiro Ishizu

Takeshi Yamamoto

Nobuyuki Hayashi

Atsuya Niwano

Takefumi Kiwada

Takahiro Ito

Aki Hiroshima

Makoto Furuta

Ryohei Kanno

Yasuhiro Tsujimoto

Takashi Kozawa

A measuring apparatus of the present invention includes a stage on which a measured object is placed, a measurement head having an information obtainer obtaining an image of the object, and a vertical driver supporting the measurement head so as to allow movement in a vertical direction. The vertical driver includes a counterbalance mechanism having a hanger of the measurement head, a pulley winding up and withdrawing the hanger by rotation, a spring increasing elastic force by stretching the spring when the measurement head displaces downward, and a cam rotating in conjunction with the pulley and having a cam shape decreasing rotational torque provided to the pulley by the elastic force as a stretching amount of the spring increases.

Measuring apparatus

A measuring instrument includes a main body casing, a detector on the main body casing and detecting an amount of stylus head displacement, a display on an outer surface of the casing; a plurality of key switches on the outer surface, a menu proximate the display on the outer surface, and a display controller controlling the display. The display includes a main display and a cursor display, which is arranged in a location alongside the menu and displays a cursor pointing to the menu, and performs control such that a measured value based on an amount of displacement is displayed, but the cursor is not displayed when in a measurement mode where the detector detects the amount of displacement, and such that a cursor is displayed so as to point to the menu corresponding to a selected menu when in a settings mode where measurement conditions are set.

Measuring instrument

A measuring instrument includes: an XY stage on which an object to be measured is placed; a probe holder having a plurality of probes; and a relative moving mechanism that relatively moves the XY stage and the probe holder. The probe holder is provided with a probe selection mechanism that has two guide rails obliquely arranged and advances and retracts at least two of the probes to be selectively positioned at and away from a probe selection position.

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Kawasaki, Japan

Kazuhiro Ishizu