Olympus Corporation

Mitsubishi Electric Corporation

Pioneer Electronic Corporation

Jfe Metal Products & Engineering Inc.

Mitsubishi Chemical Corporation

Kazuhiro Hayashi

Minoru Sukekawa

Keiji Shimizu

Takashi Yuguchi

Tsuyoshi Mochizuki

Yukio Matsumoto

Kenichi Kusaka

Hiroyuki Ishihara

Makio Yamaki

Kenji Kawasaki

Kazuo Watanabe

Susumu Honda

Yoshihiro Kawano

Takayuki Kono

Jun Honda

Masayoshi Karasawa

Akihiko Yoshikawa

Tatsushi Iizuka

Kazunaga Ida

Akira Esaki

Norimichi Katsumura

Kunihiro Miyata

Toshiyuki Naoe

Akitoshi Yoshimoto

Michitaka Fujita

Kazuhiro Yatsukawa

An illumination apparatus includes a surface light source that emits illumination light and a micro louver film that limits components of a divergence of the illumination light that are parallel to a light emission plane of the surface light source. The illumination apparatus satisfies the following conditional expression:20&#xb0;&#x2264;&#x2264;60&#xb0;&#x2003;&#x2003;(1)

Illumination apparatus, microscope apparatus, and cartridge

Display screen with graphical user interface

An object of the present invention is to provide an organism cultivation facility suitable for industrial, economical, and large-scale cultivation of an organism by efficient air conditioning which is required for the cultivation of the organism. The object can be achieved with an organism cultivation facility comprising, in a building: a cultivation unit having organism containers capable of storing organisms, and a support structure that supports the organism containers; and a conveying device for the organism containers; wherein the organism cultivation facility has a partition wall(s) that can divide the space of the operating area of the conveying device into two or more spaces in the height direction, and at least a part of the partition wall is movable.

Plant cultivation facility

A disk scanning apparatus is used in combination with an imaging optical system and an imaging apparatus. The disk scanning apparatus includes a rotating disk and a relay optical system. In the rotating disk, a disk surface including a shielding part and a transmitting part is placed so as to be positioned on a focal plane of the imaging optical system. The relay optical system performs relaying of an optical image of a sample to the imaging apparatus. The relay optical system includes a front group having a positive power and a rear group having a positive power, in this order from the rotating disk side, and is configured so that a luminous flux between the front group and the rear group becomes an afocal luminous flux. The disk scanning apparatus further includes a structure configured to make the distance between the front group and the rear group variable.

Disk scanning apparatus and microscope apparatus

A variable power relay optical system is arranged closer to an image side than an imaging optical system. The variable power relay optical system includes, in order from a side of the imaging optical system, a front group that is arranged between the imaging optical system and a position of an image of a sample that is formed by the imaging optical system, the front group forming an intermediate image formed by reducing the image, and a rear group that forms a relay image formed by magnifying the intermediate image, the rear group including a plurality of lens groups that each move along an optical axis so as to change magnification of the rear group without changing a distance from the front group to the relay image.

Imaging apparatus including variable power relay optical system

A projection blackboard having both of an excellent blackboard function and an excellent screen function, and a process for producing the same. The surface enamel layer that is an outermost layer of the enamel layers is formed by using a enameling upper glaze wherein at least titanium oxide coated particles, or a titanium oxide glaze together therewith is blended into a transparent mat glaze, so as to render the layer an enamel layer having a predetermined color tone, a surface characteristic that the Rz is from 5 to 25 &#x3bc;m and a reflective characteristic that the peak gain is 0.28 or more, or having these properties and a glossiness Gs (75&#xb0;) of 1 to 30%. This makes it possible to produce a blackboard excellent in both of blackboard function and screen function. The titanium oxide coated particles are preferably particles wherein surfaces of mica particles are coated with titanium oxide.

Process for producing a projection blackboard

A microscope includes: a first epi-illumination light-source unit to perform fluorescence observation; a second transmitted-illumination light-source unit to perform transmission observation, the second transmitted-illumination light-source unit including a light source provided with a light emitting element that emits excitation light and a fluorescent substance that emits fluorescence upon irradiation with the excitation light; and an incidence limiting section configured to limit an incidence of light on the light source from an outside of the second light source unit during a light-off period of the light emitting element. The incidence limiting section is configured to remove an incidence limitation of the light from the outside while the light emitting element is being lit.

Microscope and microscope light source unit

A projection blackboard having both of an excellent blackboard function and an excellent screen function, and a process for producing the same. The surface enamel layer that is an outermost layer of the enamel layers is formed by using a enameling upper glaze wherein at least titanium oxide coated particles, or a titanium oxide glaze together therewith is blended into a. transparent mat glaze, so as to render the layer an enamel layer having a predetermined color tone, a surface characteristic that the Rz is from 5 to 25 &#x3bc;m and a reflective characteristic that the peak gain is 0.28 or more, or having these properties and a glossiness Gs(75&#xb0;)of 1 to 30%. This makes it possible to produce a blackboard excellent in both of blackboard function and screen function. The titanium oxide coated particles are preferably particles wherein surfaces of mica particles are coated with titanium oxide.

Projection blackboard

An observation optical system includes, in order from a sample side, an infinity-corrected objective, a first lens group having a positive power, a second lens group having a positive power, and a tube lens having a positive power. An intermediate image is formed between the first lens group and the second lens group, and at a front side focal position of the second lens group. A space along an optical axis between the objective and the first lens group is configured to be changeable, and a space along an optical axis between the second lens group and the tube lens is configured to be changeable.

Observation optical system and microscope including the observation optical system

An illumination optical system includes, in order from a light source side a collector lens, a field stop, a field lens having positive power, an aperture stop, and a collective lens having positive power. The illumination optical system is a substantially both-side telecentric optical system between the field stop and a sample surface, and satisfies the following conditional expressions where Dindicates a diameter of the field stop, &#x3b2; indicates a magnification from the sample surface to the field stop, and NA indicates a numerical aperture on the sample surface side of the illumination optical system.15&#x2267;/&#x3b2;&#x2267;9&#x2003;&#x2003;(1)0.85&#x2267;&#x2267;0.5&#x2003;&#x2003;(2)

Illumination optical system for microscope, and microscope

Provided are an illuminating optical system which illuminates a sample, an illumination-side pupil modulating device which is arranged on a side of the illuminating optical system, an illumination-side turret which holds the illumination-side pupil modulating device, an illumination-side-turret revolving mechanism which revolves the illumination-side turret to move the illumination-side pupil modulating device along an orbital circumference on a plane perpendicular to an optical axis, a relaying optical system which relays a pupil of an objective lens, an imaging-side pupil modulating device which is arranged on a side of the relaying optical system, an imaging-side turret which holds the imaging-side pupil modulating device, and an imaging-side-turret revolving mechanism which revolves the imaging-side turret to move the imaging-side pupil modulating device along the orbital circumference on a plane perpendicular to the optical axis.

Microscope

This is an optical apparatus provided with an objective with a correction collar for correcting aberration due to an error in the optical thickness of a piece of cover glass comprising a focusing mechanism for changing a distance between the objective and the sample, an optical thickness detecting unit for detecting the optical thickness of the cover glass, an operating unit for calculating the amount of aberration correction, based on the optical thickness of the cover glass detected by the optical thickness detecting unit, a driver unit for driving a correction collar, based on the amount of aberration correction calculated by the operating unit and an imaging sensor for forming the image of the sample that passes through the objective.

Growing community of inventors

Tokyo, Japan

Kazuhiro Hayashi