Other

Kazue Kikuchi

Kazuyoshi Oshima

Michitaro Kanamitsu

Shinji Udo

Kiichi Manita

Akihiko Hoshida

Masahiro Sakai

Hiyori Koyama

Kazuaki Ujiie

A counter circuit for counting the number of fails generated during the write and erase processes executed in the predetermined unit such as a sector and a comparison circuit for judging whether the value counted with the counter circuit has exceeded or not the preset allowable value for the number of fails are provided. Accordingly, when the counted value of the counter circuit has exceeded the allowable value set to a register, the write process or erase process is not performed even when a write or erase command is inputted from an external circuit. Thereby, the required test time can be shortened for the electrically programmable and erasable nonvolatile semiconductor memory device such as a flash memory.

Nonvolatile memory device

Growing community of inventors

Ootsu, Japan

Kazue Kikuchi