Horiba, Ltd.

Kazuaki Sawada

Katsuhiko Tomita

Tsuyoshi Nakanishi

Hiroki Tanabe

Susumu Mimura

Toshihiko Uno

A detector assembly for detecting a plurality of different properties at the same location at the same time is provided by integrating onto a single semiconductor substrate a first detector unit for measuring a first property and a second detector unit for measuring a second property. The first and second detector units can share, for example, a common element, such as a sensor device that can provide electrical output signals representative of, respectively, the first property and the second property. The common element can include a diaphragm with a pyroelectric element to provide a measurement of temperature and pressure.

Multiple detecting apparatus for physical phenomenon and/or chemical phenomenon

Method and equipment easily visualize various physical phenomena or chemical phenomena by simultaneously taking in, accumulating, and transferring data at a plurality of points. Electric charge is injected in potential wells constructed to vary the depth in accord with the magnitude of the physical or chemical quantity, and the physical or chemical quantity is converted into electric charge according to the depth of the potential wells.

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Hamamatsu, Japan

Kazuaki Sawada