Agilent Technologies, Inc.

Shiseido Company, Limited

Kayoko Tajima

Kiyoshi Chikamatsu

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A method for measuring the holding properties of a TFT array of an active matrix display panel comprising multiple pixel circuits with holding capacitors, this measuring method being characterized in that the multiple pixel circuits comprise at least a first pixel circuit and a second pixel circuit, and the method comprises a step for charging to the holding capacitor of the first pixel circuit, a step for then charging to the holding capacitor of the second pixel circuit, a step for performing an effect-eliminating procedure due to floating capacity, and a step for measuring the charge of the holding capacitor of the first and second pixel circuits wherein a predetermined holding time after charging has elapsed.

Method for measuring thin film transistor array of active matrix display panel

A testing method for a TFT array substrate using a self-emitting element drive where pixels are arranged in a matrix and each pixel comprises a drive transistor having a gate formed from a first structural material and a source and a drain formed from a second structural material, and a hold capacitor having a first electrode formed from the first structural material and a second electrode formed from the second structural material, where the testing method comprises a first step for applying a first voltage to the hold capacitor; a second step for applying a second voltage to the hold capacitor after the first step; a third step for measuring the charge in the pixel after applying the second voltage; and a fourth step for calculating the capacitance of the hold capacitor from the charge and the potential difference between the first voltage and the second voltage.

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Tokyo, Japan

Kayoko Tajima