Texas Instruments Corporation

Kaustubh Gadgil

Rahul Vijay Kulkarni

A method for testing an A/D converter with a built-in diagnostic circuit with a user supplied variable input voltage includes generating a charge by a binary-weighted capacitor array responsive to an external voltage and a user specified code. The method further includes applying the charge to a first input of a voltage comparator and applying a bias voltage to a second input of the voltage comparator, and generating, by the voltage comparator, a comparison voltage responsive to the applied charge and the bias voltage. The method also includes applying the comparison voltage to an input of a successive approximation register and generating, by the successive approximation register, an approximate digital code responsive to the comparison voltage. The method also includes determining if at least one bit of the approximate digital code fails to toggle independent of adjacent bits.

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Plano, TX, United States of America

Kaustubh Gadgil