Aisin Seiki Kabushiki Kaisha

Katsuya Inuzuka

Kiyokazu Ieda

Masataka Toda

Toshihiko Yoshikawa

Takashi Kurozumi

Koji Kuno

Tetsuya Ori

Syunichiro Akimae

A concave-convex surface inspection apparatus includes a slit light source unit emitting a slit light to a concave-convex surface of an object to be inspected, an image-taking unit taking an image of the concave-convex surface illuminated by the emitted slit light with an imaging optical axis intersecting with an optical axis of the slit light with a narrow-angle equal to or narrower than 30 degrees, and an evaluation section obtaining a three dimensional shape of the concave-convex surface and evaluating the obtained three dimensional shape, wherein the slit light source unit includes a slit light source and a cylindrical lens, the image-taking unit includes a telecentric lens unit, an image-taking section having an imaging surface tilted relative to the imaging optical axis for increasing a focusing range of the concave-convex surface, and a P polarizer.

Concave-convex surface inspection apparatus

An electrode is made by turning a harness such that the electrode has a predetermined are for detecting capacitance. A method of manufacturing of an electrode includes step so turning a wire, and shaping the electrode with the wire. The electrode has a predetermined area for detecting capacitance.

Electrical component and method of manufacturing the same

Growing community of inventors

Anjo, Japan

Katsuya Inuzuka