Konica Minolta, Inc.

Minolta Company, Ltd.

Konica Minolta Sensing, Inc.

Konica Minolta Optics, Inc.

Katsutoshi Tsurutani

Yoshitaka Teraoka

Yuta Yamanoi

Yoshiyuki Nagashima

Shinji Shimizu

Takashi Kawasaki

Kenji Imura

Hidehiko Fujii

Kazuya Kiyoi

Katsuhiro Takamoto

Yoshiiku Kikukawa

Wataru Yamaguchi

Kazunari Mizuguchi

Tomohiro Fukamizu

Teruo Ichikawa

Mitsuo Washino

A spectrometer includes: a diffraction means that diffracts light being measured which has entered via an entrance unit; a main sensor that receives the light being measured which has been diffracted by the diffraction means; at least one auxiliary sensor disposed in an optical path of a luminous flux that does not reach the main sensor among luminous fluxes that have entered via the entrance unit, the auxiliary sensor receiving the luminous flux; and a correction means that corrects an output value of the main sensor on the basis of an output value of the auxiliary sensor.

Spectrometer

A spectrophotometer having a light-receiving optical system that images light to be measured from a position for measurement and generates imaged light to be measured; a slit formation including a slit that causes the imaged light to be measured to pass and that generates light to be measured, which travels along a measurement optical path; a grating that diffracts the light to be measured, which travels along the measurement optical path, and generates diffracted light; a sensor that receives the diffracted light and outputs a signal representing a spectral spectrum; and an observation light source that is disposed on an optical path of zeroth light among the diffracted light and that emits observation light toward the grating at a time of observing the position for measurement.

Spectrophotometer

Observation light can be applied to a position for measurement without providing large space in a spectrophotometer, and the position for measurement can be easily known. A slit is disposed at a position optically conjugate with the position for measurement in the spectrophotometer. Light from an object to be measured passes through the slit, travels along a measurement optical path, and is subject to wavelength dispersion by a wavelength dispersing element. An observation light source is retracted outside the measurement optical path at the time of measuring a spectral spectrum. At the time of observing the position for measurement, the observation light source is inserted into the measurement optical path, and emits observation light toward the slit. Alternatively, light from an object to be measured passes through the slit, and is diffracted by a grating. The observation light source is disposed on an optical path of zeroth light. The observation light source emits observation light toward the grating at the time of observing the position for measurement.

A reflection property measuring device comprising illumination light and reflected light polarizing plates held by a holder in a mutually superposed state in a thickness direction thereof, wherein the holder has a fittingly-holding portion for setting a held posture, and each of the polarizing plates has a fitting portion fittable to the fittingly-holding portion. The fitting portions of the polarizing plates are provided at positions allowing the polarizing plates to be held by the holder in respective postures where polarizing directions thereof intersect orthogonally. A manufacturing method is disclosed for polarizing plates used in the device, wherein the illumination light and reflected light polarizing plates are manufactured in such a manner as to be punched out from the same polarizing plate material.

Reflection properties measuring device and manufacturing method for polarizing plates used in same

A spectroscopic unit and spectroscopic device according to the present invention are provided with a filter that is provided with a plurality of optical filter elements disposed in order from the entrance side to the exit side of light under measurement and has different transmission wavelengths corresponding to entrance positions along a first direction. A first optical filter element from among the plurality of optical filter elements is tilted with respect to a second optical filter element disposed adjacently to the first optical filter element as a result of the first optical filter element being rotated by a prescribed angle with a third direction that is perpendicular to both the first direction and s second direction from the entrance side to the exit side as the axis of rotation thereof or being rotated by a prescribed angle with the first direction as the axis of rotation thereof.

Spectroscopic unit and spectroscopic device using same

In a multi-angle colorimeter, a light detecting portionincludes a main light receiving window disposed in a predetermined position on a main geometry plane, and first and second auxiliary light receiving windows disposed on a secondary geometry plane, and a main photoelectric conversion element for converting a main component light received by the main light receiving window in a light reflected from a measurement point into an electrical main signal and first and second auxiliary photoelectric conversion elements for converting first and second auxiliary component lights received by the first and second auxiliary light receiving windows in the reflected light respectively into first and second electrical auxiliary signals. A calculating portion corrects the electrical main signal based on the first and second electrical auxiliary signals to obtain color information about the measurement point.

Multi-angle colorimeter

A multi-angle colorimeter employs a multi-angle mode and a symmetrical arrangement mode in an optical arrangement. Light detection on both sides of the symmetrical arrangement is performed by a single photodetector unit. The photodetector unit is used on both sides, and thus, the device becomes simpler, without any impact on individual difference in characteristics of multiple photodetector units. Conversely, elements for illumination can be used on both sides. Also in a case where multiple photodetector units are used, the size and cost of the device can be reduced with the use of a photodetector unit having a relatively low wavelength resolution as a photodetector unit to be used on one side. This enables to reduce an attitude error due to relative tilting of a measurement surface while reducing the size and cost of the device.

In a measuring probe () according to the present invention, measuring light is split into a two or more through a split optical system (), and, when each split light is received by a light-receiving sensor (B,B,B) through an interference filter (A,A,A) serving as a color filter, the split light is introduced into the interference filter (A,A,A) through a collecting lens group (C,C,C) formed as a substantially bilateral telecentric system. The interference filter (A,A,A) is formed to obtain a transmittance characteristic corresponding to a measurement parameter, depending on a condition of an intensity distribution with respect to incidents angles of light incident on the interference filter (A,A,A). Thus, the measuring probe () according to the present invention can reduce an influence of a deviation in the transmittance characteristic due to incident angles, even using the interference filter (A,A,A).

Measuring optical system, and color luminance meter and colorimeter using the same

An optical characteristic measuring apparatus of the invention is configured in such a manner that a specular reflection light component in reflection light from an object to be measured is received, and shake of the apparatus is detected based on the amount of the received light. The optical characteristic measuring apparatus having the above arrangement enables to precisely measure an optical characteristic of the object to be measured, without the need of providing a mechanical switch or a like device, and without depending on the shape of the object to be measured.

Optical characteristic measuring apparatus

A color luminance meteris provided with a polychrometeras a spectral optical system including a light receiving sensor array, a signal processing circuitand an operation control unit. The operation control unitcarries out calculations to obtain characteristics of a measurement light based on a specified spectral responsitivity, using light reception signals and specified weighting coefficients. The spectral responsitivities of light receiving sensors constructing the light receiving sensor arrayare selected such that B&#x2267;5 nm and A/B lies within a range of 1.5 to 4.0 when A, B denote the half power band width of the spectral responsitivities and a center wavelength interval of the spectral responsitivities. Accordingly, there can be provided a light measuring apparatus capable of maximally suppressing errors to highly precisely measure color luminance values and the like even in a measurement of a light lying in a narrow band such as a monochromatic light.

Light measuring apparatus and method for measuring monochromatic light

An apparatus for measuring a goniometric reflection property of a sample has: one or more illuminators; a toroidal mirror which is rotationally symmetrical around a center axis effectively contacting with a surface of the sample; a light receiver having an incident aperture on the center axis; a rotating optics which rotates around a rotation axis which effectively coincides with the center axis; and a controller for controlling operations of the illuminators, the light receiver, and the rotating optics, wherein the toroidal mirror reflects light fluxes emitted from the surface of the sample illuminated by the one or more illuminators in emitting directions perpendicular to the center axis and directs each of the light fluxes to the center axis, and wherein the rotating optics specifies one of the light fluxes reflected by the toroidal mirror and directs the specified light flux to the incident aperture of the light receiver.

Apparatus for measuring goniometric reflection property of sample

The present invention provides a three-dimensional measuring apparatus comprising a light projector for projecting light to an object, a light receiving element, a light receiving optical system for leading light projected on and then reflected by the object to the light receiving element, and a calculator for obtaining measured data for three-dimensional shape measurement based on signals output from the light receiving element. The light receiving optical system includes a first optical filter which transmits only light having substantially the same range of wavelengths as that of the light projected from the light projector, at least one second optical filter which transmits light having a different range of wavelengths as that of the first optical filter and a filter selector which selectively locates one of the first optical filter or the second filter or filters at an optical path of the light receiving optical system.

Apparatus for measuring three-dimensional shape

Optical system

A variable magnification optical system includes, from the projection side, a negative first lens unit, a positive second lens unit and a positive third lens unit. The magnification is varied by moving the first and second lens units along the optical axis. A lens element in the first lens unit and a lens element in the third lens unit are aspherical lens elements of which aspherical deviation is defined. A positive lens element in the third lens unit is made of a material of which anomalous partial dispersibility and Abbe number are defined.

Growing community of inventors

Osaka, Japan

Katsutoshi Tsurutani