Hamamatsu-photonics K.k.

Katsutoshi Nonaka

Akio Suzuki

Masahiro Hayashi

Yuuya Washiyama

Yutaka Kusuyama

Etsuo Iizuka

Takeo Sugawara

In a charged particle detecting apparatusfor which an MCP is sandwiched with an IN electrodeand an OUT electrode and an anode electrode and a rear cover are installed therebehind, the component members in the rear of the IN electrodeare arranged further inside than the IN electrodewhen viewed from an MCP incident surface, and the charged particle detecting apparatusis fixed by screwing and the like to a cabinet wall surfaceof a TOF-MS by using a flange portion provided at a part of IN electrodeprojected further outside than the rear component members.

Time of flight mass spectrometer and charged particle detector therefor

In an MCP assemblyhaving one or a plurality of MCPssandwiched with an input-side electrodeand an output-side electrode, there provided at the surface facing the MCPof at least either (preferably, both) of the input-side electrodeand the output-side electrode, is a substantially annular contact face that contacts the MCP surface to fix the same, and there provided at a periphery of the contact face is a separation surface retracted in a direction to be separated from the MCP surface. Thereby, provided is an MCP assembly having a construction enabled to prevent damage to the MCP in manufacturing and handling.

Micro channel plate assembly

In a fiber optic blockformed by bundling and integrating a plurality of optical fiberseach composed of a core regionand a clad region, an at least partially curved input end facecomposed of one end of each optical fiber and a measurement surface having a curved surface shape of a to-be-measured object are pressed against each other. Then, an optical image formed by bringing the input end face into contact with the measurement surface and output from an output end faceof the fiber optic block is used to inspect the curved surface shape of the to-be-measured object. This allows a curved surface shape inspection method capable of inspecting the shape of a curved surface easily, a fiber optic block, and a curved surface shape inspection apparatus to be achieved.

Curved surface shape inspection method, fiber optical block, and curved surface shape inspection device

The present invention relates to a charged-particle detecting apparatus having a structure which enables adjustment of a potential distribution so as to stably maintain flight loci of charged particles without depending on a change in a voltage-applied state. The charged-particle detecting apparatus comprises a first electrode, an MCP, a second electrode, a third electrode that functions as an anode, and a rear cover arranged in order along a predetermined reference axis. The third electrode is arranged on the opposite side of the MCP with respect to the second electrode, and is electrically connected to an output signal part via a capacitor. In particular, the first electrode is arranged so as to become a part of the outer surface of the charged-particle detecting apparatus, and components positioned between the first electrode and the rear cover have contours with section sizes equal to or smaller than that of the contour of the first electrode when viewed from the first electrode side toward the rear cover.

Charged-particle detecting apparatus

A radiation detector is provided with three optical members arranged so that their entrance end faces are placed on a substantially identical plane; a scintillator provided on the entrance end faces of the optical members ; a plurality of CCDs for picking up optical images outputted from exit end faces of the optical members ; and a plurality of lightguide optical members for guiding the optical images outputted from the exit end faces of the optical members , to the CCDs . The optical members are bonded and fixed to each other with an adhesive having the light-absorbing property and spacings between them are set in the range of 10 to 15 &mgr;m. A protective film is provided on the scintillator

Scintillator panel, radiation detector, and method of making scintillator panel

A radiation image sensor comprises two optical members a scintillator deposited on entrance end faces of the optical members a plurality of light-guiding optical components and a plurality of CCDs Each of the optical members is an optical member in which several millions/cm of optical fibers are disposed parallel to each other and integrally molded, whereas the optical fibers have an axis forming an acute angle with the entrance end face The two optical members are arranged such that the optical fibers respectively constituting each of the optical members have a gap therebetween widening from the entrance end face side to the exit end face side. Respective side faces of optical members are formed with ground surfaces in which the respective side faces of optical members are ground against each other.

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Hamamatsu, Japan

Katsutoshi Nonaka