Westinghouse Electric Corporation

Katsushi Ikeuchi

Takeo Kanade

Shree K Nayar

An photometric sampling apparatus for an object surface shape and reflectance extraction system includes an array of point light sources spaced apart from one another in an arcuate configuration about a common site at which an object is placed from inspection, an array of extended light sources spaced apart from one another in an arcuate configuration about and oriented in different directions toward the common site, and a viewing device for viewing the object from a single direction when placed at the common site in order to extract information corresponding to the image of the object viewed. The array of point light sources can be activated for emitting light therefrom along different orientation angles toward the object at the common site. The array of extended light sources are generated on the surface of a light-diffusing medium, such as a translucent globe, disposed between the array of point light sources and common site. Each extended source emits light from an area of points unlike each point source which emits light from a single point. A scanner device is connected to the point light sources for sequentially activating them to emit light therefrom. In response to the sequence of emitted light, the extended light sources are generated in a scanning fashion for producing a sequence of images of the object at the viewing device.

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Pittsburgh, PA, United States of America

Katsushi Ikeuchi