Seiko Instruments Inc

Sony Corporation

Katsunori Honma

Hiroshi Muramatsu

Norio Chiba

Takayasu Sado

Makoto Kurihara

Yoshikazu Yoshida

Noritaka Yamamoto

Norihiro Dejima

Akira Egawa

Tomoya Yamaura

Takeshi Itagaki

Hitoshi Nakamura

Toshihiko Sakuhara

Shuichi Wada

Hiroyuki Shigei

Kosuke Fujita

Haruhiko Yata

Nobuaki Kawai

Rikiya Ishikawa

Naofumi Yamauchi

Hidekazu Kamimura

Noritake Yamamoto

[Object] To prevent or reduce the degradation in transmission characteristics caused by fast fading (fluorescent lamp interference) to achieve optimized throughput. [Solution] A process for detecting fast fading (fluorescent lamp interference) is performed (ST). Fast fading is detected by, for example, detecting a variable light source whose frequency is twice the frequency of an alternating current power supply. When fast fading is detected, a frame length update process is performed (ST, ST). In the case of 'subject transmission' in which the subject apparatus is the transmitter of a data frame, the setting of the maximum number of aggregations in frame aggregation (A-MPDU, A-MSDU) is changed to 'the recommended maximum number of aggregations'. &#x201c;The recommended maximum number of aggregations&#x201d; is set in advance so that the UDP throughput can be maximized under the conditions where fast fading has occurred. In the case of &#x201c;subject reception&#x201d; in which the subject apparatus is the receiver of a data frame, the subject apparatus sends a request message for limiting the maximum transmission length to the communication counterpart apparatus.

Wireless communication apparatus and wireless communication method

Disclosed herein is a power supply adapter for supplying DC power to a broadcast receiver that processes a broadcast signal. The power supply adapter includes: a converter configured to generate the DC power from AC power; a broadcast signal reception section configured to receive the broadcast signal; a mixer configured to mix the broadcast signal received by the broadcast signal reception section with an output from the converter; and a supply section configured to supply an output from the mixer to the broadcast receiver.

Power supply adapter and power supply system

An illumination device for emitting light includes a light incident body having a first end portion that has a light incident surface on which light from a light source is incident, a second end portion, and an outer oval-shaped surface portion interconnection the first and second end portions. A light guide plate is optically coupled to the second end portion of the light incident body and has a light emitting surface through which light that propagates through the light incident body is emitted. The light guide plate and the light incident body are integrally formed and may comprise a one-piece body. A display device utilizes the illumination device for illuminating a display element of the non-self light emitting type.

Illumination device having elliptical body and display device using the same

A lighting device comprises a light guide plate having a light incident surface and a light exit surface, at least one point light source for emitting light that is incident on the light incident surface of the light guide plate and is guided by the light guide plate to the light exit surface of the light guide plate, and micro-structures disposed on a surface of the light guide plate that is opposite to the light exit surface thereof for scattering light from the point light source that is incident on the light incident surface. A longitudinal direction of each of the micro-structures is substantially aligned with a direction in which the light from the point light source is incident on each of the micro-structures. Each of the micro-structures has an inclined surface for reflecting the incident light toward the light exit surface of the light guide plate. A base line of the inclined surface of each micro-structure is disposed substantially orthogonal with the direction in which the light from the point light source is incident on each of the micro-structures.

Lighting device and display device using the same

Adjustments during assembly of an illuminating unit having a conventional light pipe in order to position the light pipe and a light guide plate are laborious. Further, a minute prism group having a pitch on the order of 100 &#x3bc;m must be provided to a side surface of the light pipe in order to uniformly guide illuminating light to the light guide plate. An illuminating unit of the present invention is provided with a light guide plate having an illuminating surface that is illuminated by light from a point light source, and a light pipe having an incident surface to which light from the point light source is made incident and an emerging portion from which the light emerges to the light guide plate. The emerging portion and the light guide plate are integrally joined.

Illuminating unit and display device using the unit

A satellite receiver antenna device is capable of being installed on different types of verandas. A longitudinal side of the first clamp member and a second clamp member grip the concrete wall of the veranda and the receiver antenna is clamped to the concrete wall by applying the lever principle utilizing a plurality of nuts, and by a plurality of bolts inserted in a plurality of through-holes at positions separated lengthwise along the other side of the first and second clamp members. The lengthwise center section on the first clamp member and second clamp member grip the lattice bars of lattice type verandas, and the receiver antenna is clamped to the lattice section by a plurality of nuts and by a plurality of bolts inserted in the through-holes at positions lengthwise on the first clamp member and second clamp member on both sides of the gripped lattice bars.

Antenna installation device and satellite radio frequency receiver antenna device

A proximity field optical microscope is provided which can simultaneously conduct optical observation in the ultraviolet and infrared light ranges and conduct geometrical observation and detect other physical information, wherein a microscopic opening is stably and easily formed in a probe tip with low manufacturing cost and high yield. The microscope has an optical probe which comprises a tube having a tip portion formed with a smaller diameter than an overall diameter of the tube, an optically opaque material coated on the tube, an optical microscope opening formed at the tip portion, and an optical waveguide having at least two optical end surfaces, one end surface being inserted in the tube facing the microscopic opening.

Optical probe and method for manufacturing same and scanning proximity field optical microscope

A conductive-transmission-line waveguide converter comprising a waveguide for transmitting an electromagnetic wave, a wiring board brought into contact with a side of the waveguide opposite to a side of the waveguide for inputting an electromagnetic wave, being oriented perpendicularly to a longitudinal axis of the waveguide, a first probe provided in an area on the wiring board inside the waveguide for taking in a first linearly polarized wave, and a second probe provided in an area on the wiring board inside the waveguide for taking in a second linearly polarized wave perpendicular to the first linearly polarized wave, wherein the first probe and the second probe are respectively created along mutually perpendicular first and second axis lines, which both pass through a cross point of the wiring board and the longitudinal axis of the waveguide, and a first center line passing through the middle of each transversal line segment of the first probe is shifted from the first axis line and a second center line passing through the middle of each transversal line segment of the second probe is shifted from the second axis line in such a way that, on the wiring board, the first probe is farther separated away from the second probe.

Conductive transmission line waveguide converter, microwave reception converter and satellite broadcast reception antenna

A self-emitting optical probe having a built-in light-emitting function, wherein the light-emitting mechanism and the aperture portion of the optical probe are formed by depositing an electrically conductive thin film, an organic thin film, and a metallic film by means of sputtering and oblique vacuum evaporation while rotating the core. The self-emitting optical probe enables an inexpensive scanning near field optical microscope yet simplified in operation.

Self-emitting optical probe, method for producing the same, and scanning near-field optical microscope

In a method for sharpening a probe, a probe preform having a longitudinal axis is at least partially immersed in a mixture containing at least an etch solution and a non-etch solution having a lower specific gravity than and which is not miscible with the etch solution. The probe preform is moved in the mixture along the longitudinal axis thereof during etching at a speed which does not exceed a taper length forming speed for a probe preform which is not moved in the etch solution during etching. An end of the probe preform is etched into a sharp tapered tip having a taper angle greater than that obtained for the probe preform which is not moved during etching.

Method for sharpening a probe

An easy to use scanning probe instrument such as a microscope or memory device is provided with a probe which does not require optical alignment. The scanning probe is a cantilever probe adapted to undergo relative movement with respect to an object such as a sample or a recording media. Optical interference and/or displacement of the cantilever probe caused by interaction with the object while the probe is being scanned across the object is measured to determine characteristics of the object. The cantilever probe has a base member, a cantilever formed in the base member, at least a portion of the cantilever being elastically deflectable to enable the cantilever to be displaced in a given direction. A waveguide extends through the base member and has one end surface disposed proximate the cantilever, the one end surface being positioned perpendicularly with respect to the given direction of displacement of the cantilever and being spaced from the cantilever by a distance sufficient to allow displacement of the cantilever by a desired amount in the given direction.

Scanning probe and scanning probe microscope

A microscopic area scanning apparatus is provided with at least three hollow cylindrical piezoelectric elements each driven in three XYZ directions by one of divided electrodes. Three or more hollow cylindrical piezoelectric elements are arranged on a circumference of a common plane. Balls are each axially provided at a free end of the hollow cylindrical piezoelectric element. Ball retainers rotatably and slidably support a respective ball in contact therewith. A sample stage is fixed to the ball retainers. A table fixes the hollow cylindrical piezoelectric elements on the circumference of the common plane. Thus, the microscopic area scanning apparatus can realize both a wide X-Y scanning range and a high Z-direction resonant frequency without utilizing an elastic hinge.

Microscopic area scanning apparatus

A scanning near-field optic/atomic-force microscope comprises a holder for holding a sample immersed in a liquid, and a plate disposed over the holder for covering a surface of the liquid and for transmitting therethrough a laser light. A probe has an optical propagation body terminating in a distal end, and a light reflecting element disposed thereon, and the probe is immersed in the liquid. A light source emits a light which is introduced into the optical propagation body of the probe, which guides the light through the probe and out the distal end thereof to irradiate the sample. A detecting device detects information from the light irradiated on the sample and converts the information to an electric signal. A laser source irradiates the light reflecting element of the probe with a laser light for detecting a bending amount of the probe resulting from an interaction between the sample and the probe. An angle adjusting mechanism adjusts an optical axis of the laser light transmitted through the plate. A photoelectric conversion device receives the laser light reflected from the light reflecting element and converts the reflected light into an electric signal. A moving mechanism moves the sample relative to the probe, and a distance control device controls a distance between the surface of the sample and the distal end of the probe.

Scanning near-field optic/atomic-force microscope with observing

In a method of making a cantilever for atomic force micoscopes, to provide a method of manufacturing a high-resolution cantilever having a sharpened metal needle by introducing an electrolytic polishing process. In the method of making a cantilever, an erect metal structure, an electrode layer and an electric insulation layer are formed, and they are subjected to the electrolytic polishing process to allow a large number of erect metal structures formed on a silicon wafer to be formed into sharpened metal needles at a time. The cantilever having a sharpened metal needle manufactured by the method of this invention makes it possible to measure with high resolution specimen surface with deep grooves and holes and high projections that cannot be measured by the conventional cantilever having a pyramidal needle.

Growing community of inventors

Chiba, Japan

Katsunori Honma