Sharp Kabushiki Kaisha Corporation

Katsumi Irie

Yuzuru Kanemori

Mikio Katayama

Masaya Okamoto

Hiroaki Kato

Kozo Yano

Takafumi Hayama

Hideji Marumoto

Naofumi Kondo

Toshiaki Fujihara

Kiyoshi Nakazawa

Hidenori Negoto

Kazuyori Mitsumoto

Hiroshi Fujiki

Nobuyuki Kawase

Touko Kasahara

Kumiko Otsu

Akihiro Yamamoto

Yoshiharu Kataoka

Akihiko Imaya

Hisakazu Nakamura

Takashi Fujikawa

Kyoushi Tanaka

Hiroshi Shimokawa

Koji Fukuda

Masasi Hosomi

Yuichiro Mochizuki

Yuuichirou Mochizuki

Tsuyoshi Nagai

Hiroshi Shibuya

A liquid crystal display apparatus has an improved repair success rate. In the liquid crystal display apparatus, a pixel electrode is electrically connected to a drain electrode of a thin-film transistor. The drain electrode has a substantial correction site which is narrowed in width. An opening is formed in a certain region of said pixel electrode, overlying the substantial correction site of the drain electrode, the opening being in contact with the outer periphery of the pixel electrode.

Liquid crystal display apparatus

The active matrix liquid crystal panel of this invention includes: a plurality of scanning lines and a plurality of signal lines arranged to cross each other; a plurality of pixel electrodes arranged in respective regions defined by the plurality of scanning lines and the plurality of signal lines; and a plurality of switching elements for driving the plurality of pixel electrodes, wherein each of the plurality of pixel electrodes overlaps at least one of the adjacent scanning lines and signal lines among the plurality of scanning lines and signal lines via an insulating film, and at least one of the plurality of pixel electrodes is electrically connected with the overlapped line.

Active matrix liquid crystal panel and method for repairing defect

Disclosed herein is a method for detecting a defect of an active matrix liquid crystal panel, the method including a step of inputting a data signal for displaying an image having a luminance level lower than a maximum luminance level to a first signal line while inputting a data signal for displaying a black image to a second signal line and a third signal line, the second signal line and the third signal line adjoining the first signal line, thereby causing pixels corresponding to the first signal line to display a single color. According to the method of the present invention, any defective pixel is displayed darker than normal, owing to a decrease in the transmittance, so that point defects such as S-D leak defects can be easily detected.

Method for detecting defects in an active matrix liquid crystal display

In the case where a possible defect of a liquid crystal panel is detected, after the liquid crystal panel is put into an oven with the liquid crystal panel being energized, a second inspecting pulse, which has a larger potential difference than a potential difference of a first inspecting pulse applied to a second signal line on an active matrix substrate, is applied to a second signal line. In the above method, since an insulating layer, which is on the verge of breakage, between a source line and the second signal line can be broken, a possible defect of the liquid crystal panel can be detected as a cross bright line by inspection for turning-on in the panel inspecting step. For this reason, in this method, accuracy of detecting a possible defect can be improved, and the number of S-G leaks in the market is decreased greatly, thereby improving display quality of the liquid crystal panel.

Method of detecting possible defect of liquid crystal panel

Common lines are formed in parallel with gate lines. A line which joins those parallel lines is provided in parallel with source lines on the substrate edge part on the gate line terminals side. Another line which joins the same parallel lines is provided in parallel with source lines on the substrate edge part on the opposite side of the gate line terminals. These two terminals are supplied with a signal which is identical with the common signal being applied to an opposing electrode. Depressed portions are provided for each pixel electrode at positions where the source line and common line intersect with each other or in the vicinity of the source line on both sides thereof.

Active-matrix substrate and a defect correcting method thereof

An active display device, comprising: a plurality of source buses and a plurality of gate buses; a plurality of pixel electrodes, said pixel electrodes each having associated therewith a switching element for delivering a drive signal to said pixel electrode from at least one of said source buses as a function of a signal provided by at least one of said gate buses; and means other than said switching elements for selectively electrically connecting at least one of said pixel electrodes to a corresponding one of said source buses in the event said at least one pixel electrode is considered to be defective.

Active matrix display device

The inspection apparatus of the invention inspects a display device including first and second bus lines formed on an active matrix substrate. The inspection apparatus includes a first substrate unit and a second substrate unit each having a pair of substrates and connecting films therebetween. On one substrate of each substrate unit, inspection terminals and first inspection lines are formed and each of the inspection lines are connected to one of the inspection terminals. On the other substrate of each substrate unit, second inspection lines are provided. The first and second inspection lines of the substrates are selectively connected by the connecting films. During inspection, the second inspection lines of the first substrate unit are brought directly in contact with the first bus lines, so that each of the first bus lines is connected to one of the inspection terminals of the first substrate unit. Each of the second bus lines is connected to one of the inspection terminals of the second substrate unit via the respective second inspection lines in the same way. The apparatus further includes: a driving signal input circuit for supplying driving signals for a display inspection of the display device to the inspection terminals of each substrate unit; a resistance measuring device for measuring resistances of the first and second bus lines of the display device; and a section for connecting either of the driving signal input circuit or the resistance measuring device to the first and second substrate unit.

Inspection apparatus and method for display device

An active matrix display device which includes a first and a second insulating substrates, a gate bus an adjacent gate bus, and a source bus arranged on the first substrate, a pixel electrode in a segment enclosed by the gate and the source buses, a switching element connected to the pixel electrode, the gate bus and the source bus, wherein the source bus comprises a projection extending toward the pixel electrode so as to be electrically disconnected therefrom, and the adjacent gate bus comprises a projection extending toward the pixel electrode, the source bus being overlaid on the adjacent gate bus projection with an insulating layer sandwiched therebetween, the adjacent gate bus projection being provided with an electroconductive member at the top thereof with an insulating layer sandwiched therebetween, the electroconductive member being electrically connected to the pixel electrode, and electrically disconnected from the source bus projection.

Fault tolerant active matrix display device

An active matrix display device comprising two pixel electrodes in each rectangular area defined by adjacent signal lines and adjacent scanning lines. The pixel electrodes disposed across each signal line are connected with respective switching elements, which are connected to the common scanning line and the common signal line. In this way, each pixel electrode has only one signal line formed on one side thereof. As a result, a line defect conventionally produced by a leakage between adjacent signal lines through a pixel electrode is prevented. Further, a defective pixel can be easily corrected by short-circuiting the pixel electrode with the adjacent signal line.

Growing community of inventors

Kashihara, Japan

Katsumi Irie