Matsushita Electric Industrial Co., Ltd.

Katsuki Nagahashi

Atsushi Noma

An accelerated test method evaluates, under accelerated conditions (a temperature Tand a voltage V), an endurance characteristic of a ferroelectric memory device having a capacitor element including a ferroelectric film under actual operating conditions (a temperature Tand a voltage V). An acceleration factor (K) required to evaluate the endurance characteristic is derived by using an expression: logK=A(1/V&#x2212;1/V)+B(1/VT&#x2212;1/VT) (where each of A and B is a constant).

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Osaka, Japan

Katsuki Nagahashi