Adv Antest Corporation

Honda Motor Co., Ltd.

Lintec Corporation

Mitsubishi Chemical Corporation

Katsuhiko Ikeda

Atsushi Nakajima

Hiroto Nakamura

Masayoshi Ichikawa

Aritomo Kikuchi

Norifumi Hirota

Naoki Kubota

Kenji Hirano

Kenji Kaneta

Akihiro Itou

Fumio Hayakawa

Atsuhiro Tanaka

Jinji Tokita

Provided is a protective sheet for a coating layer comprising a substrate sheet and provided thereon a pressure-sensitive adhesive layer, which can be applied as well to a coated surface insufficiently cured immediately after dried, and the pressure-sensitive adhesive layer described above comprises an addition reaction type silicone-based pressure-sensitive adhesive.

Protection sheet for coating film

An electronic device testing apparatus for conveying electronic devices to be tested to sockets of a contact portion and bringing the electronic devices to be tested electrically contact with the sockets to conduct a test of electric characteristics of the electronic devices to be tested, comprising an image pickup portion that takes an image of the sockets; a memory portion that stores reference image data of the sockets in a state of not being attached with any electronic devices to be tested obtained by taking images by the image pickup portion; and a mislay determination portion that obtains check image data of the sockets from the image pickup portion, reads the reference image data from the memory portion, compares the check image data with the reference image data and determines whether any of the electronic devices to be tested remain on the sockets.

Electronic device testing apparatus

In an electronic device test apparatus using image processing technology to position an IC device relative to a socket, a calibration method of an electronic device test apparatus of calibrating a relative position of a device camera with respect to a socket, the method comprising: calculating an offset amount of a socket guide with respect to the socket on the basis of a relative position of the socket camera with respect to the socket guide and a relative position of a socket camera with respect to the socket; and adding this offset amount to the relative position of the device camera with respect to the socket guide so as to calculate the relative position of the device camera with respect to the socket.

Calibration method of electronic device test apparatus

Growing community of inventors

Tokyo, Japan

Katsuhiko Ikeda