Hewlett-packard Company

Katherine Z Withers-Miklos

Kay C Lannen

Ted T Turner

David W Webb

Amanda L Constant

Amos H-k Leong

Sharon E LaTourrette

Amos Hong-Kiat Leong

Jeffrey C Myers

A system and method for testing an electronic circuit is disclosed. The system includes a circuit board test platform having multiple electronic test capabilities and multiple hardware resources, and a pay-per-use module that is coupled to the circuit board test platform. The pay-per-use module is adapted for monitoring use of the multiple electronic test capabilities and the hardware resources of the circuit board test platform, and for debiting a number of usage credits from a usage credit pool based on the use of the multiple electronic test capabilities and the tester hardware resources.

Pay-per-use access to multiple electronic test capabilities and tester

A system and method for testing an electronic circuit is disclosed. The system includes a circuit board test platform having multiple electronic test capabilities, and a pay-per-use module that is coupled to the circuit board test platform. The pay-per-use module is adapted for monitoring use of the multiple electronic test capabilities of the circuit board test platform, and for debiting a number of usage credits from a usage credit pool based on the use of the multiple electronic test capabilities.

Pay-per-use access to multiple electronic test capabilities

Growing community of inventors

Fort Collins, CO, United States of America

Katherine Z Withers-Miklos