Protochips, Inc.

Katherine Elizabeth Marusak

John Damiano, Jr

David P Nackashi

Daniel Stephen Gardiner

Franklin Stampley Walden, Ii

Mark Alan Uebel

Alan Philip Franks

Joshua Friend

Benjamin Jacobs

Nelson L Marthe, Jr

Benjamin Bradshaw Larson

Methods and systems for calibrating a transmission electron microscope are disclosed. A fiducial mark on the sample holder is used to identify known reference points so that a current collection area and a through-hole on the sample holder can be located. A plurality of beam current and beam area measurements are taken, and calibration tables are extrapolated from the measurements for a full range of microscope parameters. The calibration tables are then used to determine electron dose of a sample during an experiment at a given configuration.

Automated application of drift correction to sample studied under electron microscope

Disclosed herein are methods and systems of metadata management for reviewing data from microscopy experimental sessions. Image data from an experimental session is stored in an archive at one or more filepath locations, either locally or on a network. Metadata associated with the image data is stored in a database with a reference to the filepath where the raw image is stored, such that the metadata is associated in the database with the image data. A user can perform post-experimental filtering, sorting, and searching of the underlying image data using the metadata, which allows the image data to be analyzed without duplication of the image data and without manual review of each individual image. The filtered data is presented in an interactive timeline format.

Systems and methods of metadata and image management for reviewing data from transmission electron microscope (TEM) sessions

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Cary, NC, United States of America

Katherine Elizabeth Marusak