Amazon Technologies, Inc.

Nvidia Corporation

International Business Machines Corporation

Karthikeyan Natarajan

Hariharan Subramanian

Amit D Sanghani

Derek Avery Lyon

Raviprasad Venkatesha Murthy Mummidi

Harbinder Sikka

Wesley Marlin Sutton

Lijuan Luo

Shantanu Sarangi

Milind Bhaiyyasaheb Sonawane

Apolak Borthakur

Mahmut Yilmaz

Ramapulla Reddy Chennuru

Vijay Dheeraj Reddy Mandadi

Sandeep Gangundi

Kaushik Narayanun

Manjunatha Gowda

Pavan Kumar Datla Jagannadha

Long Kim Do

Venkata Satya Siva Kumar Balaga

Dheepakkumaran Jayaraman

Saravanan Sethuraman

Haoxing Ren

Adam J McPadden

Brucek Kurdo Khailany

Bo Yang

Ekanth Sethuramalingam

Anubhav Sinha

Tathagato Bose

Gunja Agrawal

Cristian Gabriel Gafton

Jonathon E Colburn

Theodore Allen Carroll

Sailendra Chadalavda

Keshav Sethi Attrey

Sumantra Sarkar

Kevin Wilder

Sagar Nataraj

Kashfat Khan

Yuzhe Ma

Techniques to improve the accuracy and speed for detection and remediation of difficult to test nodes in a circuit design netlist. The techniques utilize improved netlist representations, test point insertion, and trained neural networks.

Deep learning based identification of difficult to test nodes

An initial set of one or more data stores is selected for storing configuration data of a first client of a configuration discovery service. Configuration data for various items of the client's computing environment are stored at the initial set for a first time period. A configuration item, whose records were being stored at a first data store, is identified as a candidate for a data store change. Storing of at least some configuration data of the item at a different data store is initiated.

Storage management for configuration discovery data

Systems, methods, and computer program products for buffer management in a memory device are provided. Aspects include receiving, by a controller, a request to write a first data to a memory device, analyzing, by the controller, the first data to determine a data type for the first data, obtaining, by the controller, one or more input parameters associated with the memory device, and based on at least one of the one or more input parameters exceeding a first threshold, writing the first data to a write credit buffer.

Dynamic write credit buffer management of non-volatile dual inline memory module

Deep learning testability analysis with graph convolutional networks

Various systems and processes may be used for virtual disk importation. In particular implementations, systems and processes for virtual disk importation may include the ability to receive a request from a customer of a service provider network to import a virtual disk, which is accessible over a communication network, into the service provider network. The systems and processes may also include the ability to download a portion of a virtual disk file corresponding to the virtual disk, determine the type of the virtual disk by analyzing the downloaded portion, and determine the size of the virtual disk by analyzing the downloaded portion. The systems and processes may further include the ability to determine whether the virtual disk is supported by the service provider network based on the determined type of the virtual disk and download the virtual disk if the virtual disk is supported by the service provider network.

Virtual disk importation

In one embodiment, a test system comprises: a plurality of test partitions and a centralized controller configured to coordinate testing between the plurality of test partitions. At least one of the plurality of test partitions comprises: a partition test interface controller configured to control testing within at least one test partition in accordance with dynamic selection of a test mode, and at least one test chain configured to perform test operations. The dynamic selection of the test mode and control of testing within a test partition can be independent of selection of a test mode and control in others of the plurality of test partitions. In one embodiment, a free running clock signal is coupled to a test partition, and the partition test mode controller transforms the free running clock signal into a local partition test clock which is controlled in accordance with the dynamic selection of the test mode.

Dynamic independent test partition clock

Granular dynamic test systems and methods facilitate efficient and effective timing of test operations. In one embodiment, a chip test system comprises: a first test partition operable to perform test operations based upon a first local test clock signal; a second test partition operable to perform test operations based upon a second local test clock signal; and a centralized controller configured to coordinate testing between the plurality of test partitions, wherein the coordination includes managing communication of test information between the plurality of test partitions and external pins. In one exemplary implementation, a trigger edge of the first local test clock signal is staggered with respect to a trigger edge of the second local test clock signal, wherein the stagger is coordinated to mitigate power consumption by test operations in the first test partition and test operations in the second test partition.

Independent test partition clock coordination across multiple test partitions

A computing resource service provider may receive, from a user client connected to an on-premises network, a security document specifying one or more user roles defining a level of access to customer resources within the on-premises network. In response, the service provider may generate and provide the user client with a cookie specifying the user roles and including an address for an interface within the service provider network. The service provider may receive a request from the user client to access one or more customer resources hosted by the service provider. The request may include the cookie previously provided to the user client. Accordingly, the service provider may extract the user roles from the cookie and determine, based at least in part on these user roles, whether to fulfill the user client request.

Permissions for hybrid distributed network resources

At a configuration discovery service, a unique service-side identifier is generated for a configuration item based on analysis of a data set obtained from a first data source. A determination is made that a second data set, which does not contain the service-side identifier and is obtained from a different data source, also includes information pertaining to the same configuration item. A coalesced configuration record for the configuration item is prepared. The coalesced configuration record is stored at a repository and used to respond to a programmatic query.

Intelligent configuration discovery techniques

Configuration items of an environment for a client of a configuration discovery service are identified. A view category is selected for the target environment. A set of configuration items for which information regarding recent configuration changes is to be provided is identified. Data which can be used to display a graphical representation of at least a portion of the environment and the configuration changes is transmitted.

Configuration discovery service data visualization

A customer network client detects, through a user interface, selection of a graphical representation of a set of virtual machine images and an indication to migrate this set of virtual machine images to an off-premises network managed by a computing resource service provider. In response, the client generates a set of application programming interface calls, which may be transmitted to the service provider and causes the service provider to convert the selected images for use within the off-premises network. The client monitors fulfillment of the calls and, upon determining that the calls has been fulfilled, updates a portion of the user interface associated with the computing resource service provider to indicate that the images may be instantiated within the off-premises network.

Migration of computer system images through a customer interface

Various aspects described or referenced herein are directed to different methods, systems, and computer program products for implementing hybrid on-chip clock controller techniques for facilitating at-speed scan testing and scan architecture support.

Hybrid on-chip clock controller techniques for facilitating at-speed scan testing and scan architecture support

Growing community of inventors

Fremont, CA, United States of America

Karthikeyan Natarajan