Dpix, LLC

Karthik Nagarajan

Byung-Kyu Park

Ick-Hwan Ko

Shawn Michael O'Rourke

Jungwon Park

Yang-Wen Chen

Edward Myers

An ESD circuit includes a first metal oxide channel device having a drain coupled to a first node, a source coupled to a second node, and a gate coupled to the first node; a second metal oxide channel device having a source coupled to the first node, a drain coupled to the second node, and a gate coupled to the second node; a first capacitor coupled between the first and second nodes proximate to the first metal oxide channel device; and a second capacitor coupled between the first and second nodes proximate to the second metal oxide channel device. The ESD circuit can further include a third capacitor coupled between the first and second nodes proximate to the first capacitor. The ESD circuit can further include a fourth capacitor coupled between the first and second nodes proximate to the second capacitor.

Electrostatic discharge (ESD) protection for the metal oxide medical device products

A test structure for characterizing an organic photodiode image sensor includes, on a common substrate, a cathode sheet resistance portion; a diode capacitance portion; an organic photodiode sheet resistance portion; a contact resistance portion; a step coverage portion; a quantum efficiency portion; a film adhesion portion; and an inkjet printing portion. The organic photodiode sheet resistance portion includes gate metal sets, each gate metal set including four evenly spaced metal lines terminating in a probe point, wherein the spacing within each gate metal set is progressively increased from a first gate metal set to a last gate metal set, and wherein a spacing between each gate metal set is larger than the spacing within any gate metal set; and an organic photodiode sheet formed over the gate metal sets.

Test structures for manufacturing process of organic photo diode imaging array

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Colorado Springs, CO, United States of America

Karthik Nagarajan