Qualcomm Incorporated

Karthik Moncombu Ramakrishnan

Jeffrey Douglas Carr

Dennis Michael Feenaghty

David Noel Collins

Anushruti Bhattacharya

Gaurav Verma

Ryan Reddy Wendlandt

Prachi Deshpande

Gaurav Singhania

Methods and systems for automated testing of extremely-high frequency devices are disclosed. A device under test (DUT) is set in a simultaneous transmit and receive mode. The DUT receives a lower frequency radio frequency (RF) signal from a test unit and up-converts the lower frequency RF signal to a higher frequency RF signal. The DUT transmits the higher frequency RF signal using a first antenna, and receives the higher frequency RF signal using a second antenna. The DUT down-converts the received higher frequency RF signal to a received test RF signal and provides the received test RF signal to the test unit for comparing measurements derived from the received test signal to a design specification for the DUT.

Self-radiated loopback test procedure for millimeter wave antennas

Growing community of inventors

Chennai, India

Karthik Moncombu Ramakrishnan