Accenture Global Solutions Limited

Karthik Acharyulu

Sanjay Podder

Shubhashis Sengupta

Janardan Misra

Neville Dubash

Venkatesh K Subramanian

Nisha Ramachandra

Subramanian Palanisami

Bruno Marra

Kaushik Turlapaty

Padmaraj Bhat

A device may identify a first concept hierarchy of a first multimedia presentation and a second concept hierarchy of a second multimedia presentation. The device may determine a set of concepts associated with the first concept hierarchy and the second concept hierarchy and may determine a plurality of similarity scores associated with the set of concepts. The device may generate a new concept hierarchy based on the plurality of similarity scores, the first concept hierarchy, and the second concept hierarchy by: performing a first process to merge a concept with an additional concept; performing a second process to position a concept sequentially before or after an additional concept; performing a third process to position a concept and a different concept to sequentially follow an additional concept; and performing a fourth process to position a concept to sequentially follow an additional concept and a different concept.

Facilitating merging of concept hierarchies

A device may receive a first command, included in a set of commands, to set a configuration parameter associated with performing feature extraction. The device may receive a second command, included in the set of commands, to set a corresponding value for the configuration parameter. The configuration parameter and the corresponding value may correspond to a particular feature metric that is to be extracted. The device may configure, based on the configuration parameter and the corresponding value, feature extraction for a corpus of documents. The device may perform, based on configuring feature extraction for the corpus, feature extraction on the corpus to determine the particular feature metric. The device may generate a feature vector based on performing the feature extraction. The feature vector may include the particular feature metric. The feature vector may include a feature identifier identifying the particular feature metric. The device may provide the feature vector.

Feature extraction for machine learning

Growing community of inventors

Bengaluru, India

Karthik Acharyulu