Western Digital Technologies, Inc.

Karsten C Strecke

Marc A Bombet

Carl R Messenger

A data storage device (DSD) test system is disclosed comprising a first DSD tester operable to download a first version of an operating system to a first DSD and execute a first test on the first DSD, and a second DSD tester operable to download a second version of the operating system to a second DSD and execute a second test on the second DSD while the first DSD tester is executing the first test on the first DSD.

Testing data storage devices running different versions of an operating system

A method is disclosed of configuring a data storage device. A manufacturing procedure is executed to generate a configuration data record. The configuration data record is compared to configuration execution records of an executable file, wherein the configuration execution records are for configuring at least one configuration file of the data storage device. When the configuration data record interlocks with the configuration execution records, the configuration file is modified.

Growing community of inventors

Huntington Beach, CA, United States of America

Karsten C Strecke