Focalspec Oy

Valmet Automation Oy

Karri Niemelä

Heimo Keranen

Jussi Graeffe

Pekka Suopajärvi

Heimo Keränen

Markku MÄNTYLÄ

A measuring apparatus is provided for inspecting a seal of an item. The measuring apparatus includes a radiation source for providing radiation for illuminating the seal of the item, a detector for receiving radiation from the item for generating a corresponding detected signal, and a processing arrangement for processing the detected signal to generate an output signal indicative of a state of the seal. The radiation source is arranged to focus the radiation into a plurality of focal points at the seal of the item, wherein the focal points are mutually spatially spaced apart. Moreover, the detector is arranged to image one or more of the focal points and to be selectively sensitive to an intensity of radiation received from the one or more focal points to generate a detected signal.

Apparatus and method for inspecting seals of items

A measurement device for the determination of the characteristics of the object's surface by means of the optical radiation, wherein a measurement device comprises an optical radiation source and a detector to receive the radiation reflected from the surface being measured. In addition, a measurement device comprises an emitted optical radiation processing unit, which is adjusted to split optical radiation emitted by an optical source into separate wavelengths and to direct said separate wavelengths to the object being measured in a direction, that differs from the normal of the surface being measured so, that at least the shortest and the longest wavelengths of said wavelengths are focused on different halves and different heights of the measured object's surface, in the direction of the normal of the surface being measured. In addition, a measurement device comprises a reflected optical radiation processing unit, which is adjusted to receive an optical radiation reflected from the measured object at least in the direction of a specular reflection, which differs from the normal of the surface being measured, and to direct received optical radiation to said detector. Still further, the measurement device is adjusted to analyze an electric signal produced by the detector and proportional to the intensity of the radiation focused thereto, and to further determine a surface gloss (gloss degree) and/or thickness characteristic property of the measured object, based on the intensity of its wavelength, the focus point of which was located on the measured surface, and which wavelength was the strongest reflected from that point to the detector in the specular geometry.

Measuring instrument and method for determination of the properties of an item and its surface

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Oulu, Finland

Karri Niemelä