Seagate Technology Incorporated

Karl Louis Enarson

John Edward Moon

Anish A Ukani

Timothy Ted Walker

John M Baker

Brett Alan Sloan

Ronald D Metzner

Hieu Van Nguyen

Christopher R Fulkerson

Paul Francis Kusbel

David R Street

Shawn Alan Wakefield

Ronald L Delamarter

Philip E Cloud

Deanne Sue Grover

In a particular embodiment, a system is disclosed that includes a controller to read data from and write data to a first storage medium. The controller is adapted to monitor logical block addresses (LBAs) of each read operation from the first storage medium and to selectively store files associated with the monitored LBAs that are less than a predetermined length at a second storage medium to enhance performance of applications associated with the LBAs.

Storage device with manual learning

In a particular embodiment, a data storage device is disclosed that can include a data storage medium having a device failure partition including a device failure log to store operational state information. The operational state information can include commands, data, performance data, and environmental data associated with the data storage device. The data storage device can further include a controller adapted to selectively store the operational state information to the device failure log in a first-in first-out (FIFO) order representing recent states of the data storage device.

Data storage device including a failure diagnostic log

Apparatus and method for enhancing disc drive reliability by applying reduced read bias levels to read elements of a disc drive during an idle mode of operation. A preamplifier driver circuit applies an operational read bias signal of selected, nonzero magnitude to the read element to transduce data from a recording surface during an active mode. Once a predetermined period of inactivity occurs during which host data transfer commands are not processed, the disc drive enters the idle mode and the preamplifier reduces the read bias signal magnitude. The reduced bias level during the idle mode reduces thermal stress and electromigration within the read element while still allowing data to be transduced from the recording surface as the drive performs a dithering operation to move the head to different tracks on the recording surface.

Application of reduced bias levels to disc drive read elements during periods of inactivity

A method and apparatus are disclosed for optimizing operational performance of a disc drive. The disc drive is provided with an integrated temperature measurement circuit which provides a temperature measurement signal indicative of operational temperature of the disc drive. The integrated temperature measurement circuit is formed as part of an application specific integrated circuit (ASIC) housing additional circuitry used by the disc drive during operation. A parametric configuration circuit, operably coupled to the integrated temperature measurement circuit, identifies selected parameters for use by the disc drive to optimize disc drive performance, the parameters arranged as a plurality of parameter sets corresponding to a plurality of predefined operational temperature ranges. The parametric configuration circuit periodically measures the operational temperature of the disc drive through evaluation of the temperature measurement signal, identifies the operational temperature range in which the measured operational temperature falls, and implements the parameter set corresponding to the identified operational temperature range.

Integrated temperature sense circuit in a disc drive

An apparatus and method are disclosed for optimizing the operational performance of a disc drive having a head adjacent a rotatable disc, a servo circuit which controls the position of the head and a read channel for decoding read signals from the head to reconstruct data previously stored on the disc. The read channel includes a channel quality monitor which generates a channel quality measurement indicative of read channel quality, the channel quality measurement determined from error values associated with the data reconstructed by the read channel from the read signal. An optimum value for a selected parameter affecting disc drive performance is selected by determining an associated quality measurement value for each of a plurality of parameter values, and selecting the optimum value for the parameter in relation to the associated quality measurement values. Preferably, each associated quality measurement value is determined in less than one revolution of the disc.

Parametric optimization using disc drive read channel quality measurements

Method and apparatus for predicting future failure of a disc drive head from degradation in a head readback response characteristic, such as electrical resistance, readback signal amplitude, asymmetry or nonlinearity. During manufacturing, the disc drive determines and store a baseline level for a selected readback response characteristic of the head indicative of head performance as data are read back from a disc. During subsequent data processing use, the disc drive subsequently periodically determines a subsequent level for the readback response characteristic of the head. The possibility of a future failure of the drive is next predicted in relation to a difference between the baseline level and the subsequent level for the readback response characteristic of the head. An indication of the possibility of the future failure is provided to allow a host device to reallocate data stored on the disc before the failure of the head.

Detecting head readback response degradation in a disc drive

An apparatus and method are disclosed for determining a maximum magnitude of bias current that can be safely applied to a head of a disc drive. The disc drive comprises a head disposed adjacent a rotatable disc having a recording surface on which data are magnetically stored, a preamplifier circuit which selectively applies bias currents to the head, and a head bias current selection circuit, operably coupled to the preamplifier circuit, which first determines the maximum magnitude of bias current that can be applied to the head in relation to a maximum power dissipation rating of the head and voltage measured across the head when at least one initial bias current of selected magnitude is applied to the head. Thereafter, a range of bias currents having different magnitudes less than or equal to the maximum magnitude are selected and evaluated to select an optimum magnitude for subsequent use by the drive.

Disc drive head bias current optimization

A method and apparatus are disclosed for optimizing operational performance of a disc drive through temperature dependent parametric configuration. A plurality of parameter sets corresponding to a plurality of predefined contiguous operational temperature ranges of the disc drive are initially established. During operation of the disc drive, a temperature sensor is used to periodically measure the temperature of the drive. The operational temperature range in which the measured temperature falls is identified, and the disc drive utilizes the parameter set corresponding to the identified operational temperature range.

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Yukon, OK, United States of America

Karl Louis Enarson