International Business Machines Corporation

Karl K Moody, Iii

David James Hathaway

Bhavna Agrawal

David Wells Winston

Pravin Kamdar

Peng Peng

Brenda M Wilson

Pierre M Companion

Disclosed are embodiments of a system and of an associated method for estimating the leakage current of an electronic circuit. The embodiments analyze a layout of an electronic circuit in order to identify all driven and non-driven nets within the electronic circuit, to identify all of the driven net-bounded partitions within the electronic circuit (based on the driven and non-driven nets), and to identify, for each driven net-bounded partition, all possible states of the electronic circuit that can leak. Then, using this information, the embodiments estimate the leakage current of the electronic circuit. This is accomplished by first determining, for each state of each driven net-bounded partition, a leakage current of the driven net-bounded partition and a probability that the state will occur in the driven net-bounded partition during operation of the electronic circuit. Then, for each state of each driven net-bounded partition, the leakage current of the driven net-bounded partition and the state probability are multiplied together. The results are then aggregated.

System and method for estimating leakage current of an electronic circuit

A method for analyzing image data is disclosed that will find defects on a multi-layer device having solder pads, such as a semiconductor computer chip. The method provides a device template image, a theoretical image created from data from several real images, for comparison to an image of a device to be tested after the solder pad data is segmented. The parameter values of the device to be tested are recorded and compared to the parameter values of the device template, forming a difference image. The difference image and the solder pad data are then run through a series of tests, wherein the device is determined defective or not defective.

Method of analyzing visual inspection image data to find defects on a device

Growing community of inventors

Essex Junction, VT, United States of America

Karl K Moody, Iii