Leica Mikroskopie Und Systeme Gmbh

Leica Microsystems Wetzlar Gmbh

Wild Leitz Gmbh

Leitz Messtecknik Gmbh

Leica Mikroskopie Und Systeme Systeme Gmbh

Karl-Josef Schalz

Norbert Gaul

Michael Ganser

Karl Wieber

Matthias Lindner

Klaus Felgenhauer

Werner Stahl

A displacement unit for at least one element to be displaced is provided comprising a drive unit, a transfer element that is caused to move by the drive unit and that comprises a thread or a tooth set, and an engagement element, which engages into the thread or tooth set of the transfer element and is thus driven by the motion of the transfer element, and by whose motion the displaced element is moved. The engagement element is configured elastically, in such a way that it deforms elastically upon contact by the displaced element against a stop or obstacle.

Displacement unit

A modular microscope system includes a plurality of stackable housing modules each having a plurality of inwardly pointing protuberances provided with one or more precision stop surfaces thereon for removably mounting and positioning a plurality of prealigned functional element carriers having corresponding precision stop surfaces thereon for engagement with the precision stop surfaces of the housing module protuberances.

Modular microscope system

A description is given of an illuminating device for a microscope (,), having a light source (,), an illuminating optical system (,) and an LCD (,) arranged in the illuminating beam path (,). The illuminating light is directed onto the object (,) from the light source (,) via the LCD (,), a transparent/opaque pattern being generated on the LCD (,) by means of a control and calculating device (,). The LCD (,) is arranged in a plane (AP&prime;) which is conjugate with respect to the field diaphragm plane or aperture diaphragm plane (AP) and has a planar matrix composed of individual pixels arranged next to one another and of the same dimensions, the pixels each being constructed such that they can be driven individually to generate an arbitrary transparent/opaque pattern. The control and calculating device (,) is constructed as a computer with a graphics card. The graphics card generates the image signal for driving the LCD (,), it being possible for the image generated on the LCD (,) to be represented simultaneously on a separate monitor (,).

Lighting device for a microscope

A gear unit (1) for focusing microscopes and having coarse adjustment, fine adjustment and extra-fine adjustment is described, in which, for the purpose of focusing, the object stage (5) is moved via a toothed gear (6). Coaxially arranged control knobs (7, 8) are provided on the microscope as manual control elements. The control knobs (7, 8) are connected via a drive shaft (9) and the gear unit (1) to a toothed rack (10) of the object stage. The control knob (7) for fine adjustment is provided on a rotation shaft (11) arranged so as to be capable of longitudinal displacement. Arranged on this rotation shaft (11) are at least two gear wheels (12, 13) of different diameter for fine adjustment and extra-fine adjustment. One of the gear wheels (12, 13) is connected to the gear unit (1) via the longitudinal displacement of the rotation axis (11).

Gear unit for focusing microscopes

Lens change-over device with centerable reception rings

Microscope with a multi-functional adjustment knob

A microscope includes a mount 18 secured to an eyepiece tube 10 to superimpose image data upon the microscope image. The image data is projected and reflected into the intermediate image plane using a receiving unit 27 to hold the image data on a slide 29 and an optical part 12. The receiving unit 27 includes a magnetic wall surface 31 and is freely movable and arbitrarily positionable together with slide 29 on a slide surface 32. Permanent magnets 33 are provided behind the slide surface 32 within the mount 18 to keep receiving unit 27 in place.

Microscope that displays superimposed data

Universal folding condenser for microscopes

Position control system

Stationary gantry for a precision coordinate measuring instrument

A device and method for active vibration damping of an object which comprises a beam with two free ends comprises a vibration sensor, a control circuit, and an actuator. The sensor is located near the first end of the beam and the actuator is located near the second end of the beam. The control circuit converts input signals from said vibration sensor into control signals for controlling the actuator. The damping device is particularly useful where it forms part of a precision coordinate measuring machine which has a beam of varying length. In this instance, the sensor is located on a sliding spindle of the measuring machine.

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Weilburg, Germany

Karl-Josef Schalz