Hommelwerke Gmbh

Karl Hutter

Gerd Ulbers

Jorg Schmidt

Ernst Schwar

Eckehart Gortat

Bernd Dreier

Jacob Wagner

Thomas Weissweiler

Jurgen Walde

Werner Lenz

Device for the contact-free measurement of a distance from a surface, particularly for scanning the contour of a surface of a workpiece along a given measuring path, comprising a measuring body enclosing optoelectronic means for transmitting light to the surface to be measured and converting the light reflected by such surface into an electrical signal as a function of the distance from the surface. The measuring body is supported on a stand and is movable in the direction of measurement. The optoelectronic means comprise a focus position measuring system and an optoelectronic position scanning unit for scanning the position of the measuring body relative to the supporting stand. An adder connected to indicating or recording means adds the output signal of the focus position measuring system to the output signal of the position scanning unit to produce a summation signal which corresponds to the distance of the measuring body from the surface being measured at any selected point of movement of the measuring body on the supporting stand. Thus, the measured value is additively formed of two partial values, of which the partial value derived from the focus position measuring system is obtained without sluggishness, while the other partial value permits the measurement of a coarse profile.

Device for scanning the contour of a surface of a workpiece

Surface testing machine

A device for measuring small distances, provided with a sensing tip mounted to be movable in the direction of the length to be measured, a transducer for converting the movements of the sensing tip into corresponding electric signals, and indicating means to indicate such signals. The transducer comprises an optical interferometer provided with a measuring waveguide. One end of the waveguide is connected to a laser and the other end to optical means for directing the light onto a measuring mirror disposed at a distance. The light is reflected by the mirror back to the optical means. The measuring mirror is connected to the sensing tip. The interferometer further includes a reference waveguide linked to the measuring waveguide. The reference waveguide has a mirror disposed at one end and a photoelectric transduer at the other end. The transducer is connected to the indicating means for indicating the output signals of the transducer. The device permits a cost-effective and uncomplicated construction as an integrated unit. The device affords precision measurements at accuracies in the range of one half of the wavelength of the lasr beam, or even far below such a value. The device also exhibits a high linearity for substantially greater distances. The device is also suitable for measuring extremely rapid changes in length while using a small bearing pressure on the sensing tip.

Device for measuring small distances

In an apparatus for measuring the eccentricity of an eccentric bearing face having an axis of rotation, a rotary motion and a perimeter, the apparatus comprises a length measurement gauge, mounting means for mounting the length measurement gauge, means for guiding the movement of the length measurement gauge, in which the guiding means comprises a follower and two bearing tips, and means for applying the bearing tips to the eccentric bearing face. The mounting means for mounting the length measurement gauge functions to (a) maintain the length measurement gauge in the radical direction during rotary motion, and (b) enable the length measurement gauge to move perpendicularly to the axis of rotation. The guiding means functions to guide the movement of the length measurement gauge in the direction of the rotary motion of the eccentric bearing face. The guiding means comprises a follower, which is able to move radially with respect to the bearing face, and two bearing tips at a distance to one another along the perimeter of the eccentric bearing face. The follower is coupled to the length measurement gauge in the direction of its movement perpendicular to the axis of rotation.

Eccentricity measuring apparatus

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Muhlhausen, Germany

Karl Hutter