Outokumpu Oyj

Outotec Oyj

Kari Mann

Christian Von Alfthan

Kari Saloheimo

Timo Niitti

Jari Moilanen

The invention relates to an arrangement of a measuring window in a continuously operated X-ray analyzer (), said analyzer being is used particularly for analyzing elemental contents in solid, liquid or slurry-like materials; which measuring window () separates the sampling space () containing the sample material to be measured and the measurement space () containing the measuring probe (), and is sealed by a lid structure () arranged in the sampling space, said lid structure defining the measurement aperture () of the sampling space, in which case the lid structure defining the measurement aperture of the sampling space is provided with a sealing surface () of the measuring window, so that said surface is at least partly planar and at least partly curved.

Arrangement of analyzer measuring window

The invention relates to a method of and equipment for preparing an analysis sample () for a continuous on-line analysis. According to the invention, a sample material () is taken by means of a sampling arrangement () from a material flow () that contains solid matter and liquid, whereby the sample material () is fed into a chamber (); a layer of material (), which contains coarse solid matter, depositing in the lower part of the chamber, and a layer of material (), which contains liquid and fine solids, being separated from the sample material in the upper part of the chamber, whereby at least part of the material (), which contains fine solids, is moved to the lower part () of the chamber (), from where the analysis sample () that has a higher solids content than the sample material () is removed.

Method of and equipment for preparing an analysis sample

The invention relates to a device for preparing a sample meant for continuously operated on-line analysis and containing finely divided, pulverous material, so that the sample is suited for an analysing method designed to analysing the surface layer of the sample, and that a sample flow extracted from the material flow by a sampler is conducted to the device. According to the invention, in order to realize an essentially even sample material bed () to be transported past the analyser device (), the height of the sample material in the sample material bed feeder element () is maintained essentially at a predetermined value.

Device for preparing a sample for analysis

The invention relates to an analyzer measuring window and to a method for installing said measuring window in place, said measuring window being used in essentially automatic and continuously operated measurements, particularly when analyzing the element contents of solid, liquid of slurry-like materials. Said measuring window is movable with respect to the measuring aperture provided in the wall of the measuring chamber containing the measuring head of the analyzer and to the sample aperture provided in the sample chamber. According to the invention, the measuring window is made of ribbon-like material (,) which is movable in relation to the measuring aperture (,) and to the sample chamber (,) in order to replace the measuring window (,) at least between two measuring periods, and in the immediate vicinity of the measuring aperture (,), there is installed at least one stretching member (,) in order to seal the ribbon-like material at least against the wall of the measuring aperture (,).

Analyzer measuring window and method for installing said window in place

The invention relates to a sample flow control member to be used particularly in a continuously operated analysis of liquid or slurry-like materials, said control member being provided with members for selectively conducting the sample flow to an analyser. According to the invention, the control member (1, 21, 41) is installed in an essentially horizontal position and provided with at least one moving member (11, 28, 42) in order to turn the control member (1, 21, 41) around its rotation axis (12, 29, 48) in order to selectively conduct the sample flow to at least one analyser (7, 27; 44, 46) through at least one aperture (5, 25, 49) provided in the wall of the control member (1, 21, 41).

Growing community of inventors

Espoo, Finland

Kari Mann