Texas Instruments Corporation

Karan Singh Bhatia

Andrew Marshall

Karthik Subburaj

Indu Prathapan

Siraj Akhtar

Srikanth Krishnan

Vijay Kumar Reddy

Wei Fu

Rittu Kulwant Sachdev

Shailesh Joshi

Neeraj P Nayak

Pranav Sinha

Siang Tong Tan

Mayank Kumar Singh

A device comprises a digital ramp generator, an oscillator, a power amplifier, a low-noise amplifier (LNA), a mixer, and an intermediate frequency amplifier (IFA). The oscillator generates a chirp signal based on an output from the digital ramp generator. The power amplifier receives the chirp signal and outputs an amplified chirp signal to a transmitter antenna. The LNA receives a reflected chirp signal from a receiver antenna. The mixer receives output of the LNA and combines it with the chirp signal from the oscillator. The IFA receives the mixer output signal and includes a configurable high-pass filter, which has a first cutoff frequency during a first portion of the chirp signal and a second cutoff frequency during a second portion of the chirp signal. In some implementations, the first cutoff frequency is chosen based on a frequency of a blocker signal introduced by couplings between the transmitter and receiver antennas.

Intermediate frequency amplifier with a configurable high-pass filter

An amplifier comprises a common emitter stage coupled to a first and a second input, a common base stage coupled to the common emitter stage and to a first and a second output, and a cancellation path coupled to the common emitter stage and the common base stage and to the first and second outputs. The cancellation path generates a first cancellation signal that is 180 degrees out of phase with a first leakage signal at the first output and a second cancellation signal that is 180 degrees out of phase with a second leakage signal at the second output. The cancellation path comprises a first cancellation transistor coupled to the common emitter stage and the common base stage and to the first output and a second cancellation transistor coupled to the common emitter stage and the common base stage and to the second output.

Amplifier with improved isolation

An output voltage is compared to a reference voltage, comparison signals are generated, and control signals and mode signals are generated in response thereto. The output voltage is generated in response to the control signals. A speed of the comparing is increased in response to the mode signals indicating that the output voltage is being increased. The speed is reduced in response to the mode signals indicating that the output voltage is being reduced. For increasing the speed, a path is enabled to conduct current. While the path is enabled, at least one switched voltage is connected to vary an amount of the current conducted through the path. The switched voltage is at least one of the reference voltage and the output voltage. For reducing the speed, the path is disabled against conducting current. While the path is disabled, the switched voltage is disconnected from varying the amount.

Method and system for converting a DC voltage

An electronic circuit comprises a digital-to-analog converter (DAC) core circuit having a current source device and a digital input bit. An isolation circuit is also provided and is connected to the DAC core circuit. The isolation circuit is configured to selectively provide a source bias signal to the current source device. The isolation circuit also is configured to isolate the source bias signal from the current source device based on a state of the digital input bit.

Isolation circuit for a digital-to-analog converter

One embodiment relates to an on-chip power amplifier (PA) test circuit. In one embodiment, a PA test circuit comprises a controllable oscillator (CO) configured to generate a radio frequency (RF) signal, a parallel resonant circuit tuned to the radio frequency, a pre-power amplifier (PPA) coupled to the CO and the parallel resonant circuit, the PPA configured to amplify and drive the RF signal from an output of the PPA into a load. The test circuit may further comprise a first transmission gate configured to couple the RF signal from the CO to an input of the PPA. One testing methodology for a PA test circuit comprises stressing the PPA with an RF signal, measuring a characteristic of the PPA, determining stress degradation from the characteristic measurements, and repeating the stressing and characteristic measurements until a maximum stress degradation is achieved or a maximum stress has been applied.

Methodology for assessing degradation due to radio frequency excitation of transistors

A capacitor circuit and method to reduce layout area, leakage current, and to improve yield is disclosed. The circuit includes an output terminal (), a plurality of circuit elements (), and a plurality of transistors (). Each transistor has a control terminal () and a current path coupled between the output terminal and a respective circuit element of the plurality of circuit elements. A control circuit () has a plurality of output terminals (). Each output terminal is coupled to the control terminal of a respective transistor of the plurality of transistors. The control circuit produces control signals at respective output terminals to selectively turn off at least one transistor and turn on at least other transistors of the plurality of transistors at a first time.

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Plano, TX, United States of America

Karan Singh Bhatia