Infineon Technologies Ag

Kapil Gupta

Wolfgang Ruf

Georg Erhard Eggers

Reinhard Dueregger

Hartmut Berger

Markus Sickmoeller

Claus Peter

Hans-Joachim Kremer

Performance Test Board for connecting at least one device under test (DUT) to a test system which has internal power supply sources (IPS) wherein said Performance Test Board (PTB) comprises at least one DC-DC-converter having an input terminal to which several internal power supply sources of said test system are connected in parallel, an output terminal to which a power supply terminal of said device under test (DUT) is connected and a control terminal to which a further internal power supply source of said test system is connected.

Performance test board

A method for classifying semiconductor components by their performance characteristics includes reading an identifier associated with a component and storing, in conjunction with the identifier, first and second performances values for that component. These performance values represent the component's achieved operating speed at each of two different temperatures. The component is then allocated to a speed category on the basis of the first and second performance values.

Method for classifying components

Growing community of inventors

Munich, Germany

Kapil Gupta