Average Co-Inventor Count = 1.41
ph-index = 11
The patent ph-index is calculated by counting the number of publications for which an author has been cited by other authors at least that same number of times.
Company Filing History:
1. Nec Corporation (40 from 35,658 patents)
2. Nec Electronics Corporation (3 from 2,467 patents)
3. Renesas Electronics Corporation (2 from 7,524 patents)
4. Tdk Corporation (1 from 7,952 patents)
5. National Institute of Advanced Industrial Science and Technology (1 from 1,710 patents)
6. Tanaka Chemical Corporation (1 from 32 patents)
41 patents:
1. 12356754 - Infrared sensor using carbon nanotubes and method for manufacturing same
2. 11417881 - Lithium-manganese complex oxide and method for producing same
3. 10215588 - Position detecting device and structure for using position detecting device
4. 8101529 - Carbon nanotube resistor, semiconductor device, and manufacturing method thereof
5. 8085112 - Broadband transition from a via interconnection to a planar transmission line in a multilayer substrate
6. 8035992 - Vertical transitions, printed circuit boards therewith and semiconductor packages with the printed circuit boards and semiconductor chip
7. 8013685 - Broadband transition from a via interconnection to a planar transmission line in a multilayer substrate
8. 7952365 - Resonator, printed board, and method for measuring complex dielectric constant
9. 7902938 - Data transmitter, data transmission line, and data transmission method
10. 7868257 - Via transmission lines for multilayer printed circuit boards
11. 7750765 - Compact via transmission line for printed circuit board and design method of the same
12. 7463122 - Compact via transmission line for printed circuit board and its designing method
13. 6777723 - Semiconductor device having protection circuit implemented by bipolar transistor for discharging static charge current and process of fabrication
14. 6433393 - Semiconductor protective device and method for manufacturing same
15. 6275367 - Semiconductor circuit device with high electrostatic breakdown endurance