Kabushiki Kaisha Toshiba

Kaoru Kurebayashi

Takuya Kishimoto

Fumiaki Teshima

Yukihiro Mihara

Katsuhiro Inoue

A system test apparatus for verifying whether or not a tested system works according to particular specifications is disclosed. The system test apparatus comprises a storage device for storing the particular specifications as a finite state machine model including elements represented with time sections which may take place, a detecting device for periodically detecting operation information which represents an operation of the tested system as a combination of events and actions represented with the time sections which may take place and a verification device for comparing the operation information with the particular specifications stored in the storage device according to the finite state machine model. In the above finite state machine model, events, actions, and the like are represented with time sections which may take place.

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Yokohama, Japan

Kaoru Kurebayashi