Hitachi-High-Technologies Corporation

Kano Shimizu

Kazuhiro Nakamura

Satoru Chida

Hirokazu Iwamatsu

Kiyotaka Umino

The present invention provides an automatic analyzer, in which when a specimen that cannot be analyzed due to an abnormality or needs to be remeasured exists, the automatic analyzer can swiftly reload the specimen that cannot be analyzed due to the abnormality or needs to be remeasured without waiting for completion of a measurement of another specimen held by a rack holding the specimen that cannot be analyzed or needs to be remeasured. The automatic analyzer has means for storing information of a rack loaded in the analyzer and specimen information, displaying identification information of the rack loaded in the analyzer to a user, specifying a specimen that needs to be reanalyzed due to an abnormality or needs to be collected for a remeasurement, interrupting analysis of a specimen rack holding the specimen, and collecting the specimen rack. The automatic analyzer can collect and reload the specified specimen.

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Hitachinaka, Japan

Kano Shimizu